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具有花状形貌Lu_(x)Bi_(2-x)Te_(3)合金的制备及性能
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作者 吴芳 王伟 《河北大学学报(自然科学版)》 CAS 北大核心 2023年第1期58-66,共9页
Bi_(2)Te_(3)基材料在室温附近具有良好的热电性能,通过掺杂和纳米技术可以提高Bi_(2)Te_(3)基热电材料的热电性能,其主要由热电优值(ZT)决定.本文通过水热法成功制备了具有纳米花形貌的Lu_(x)Bi_(2-x)Te_(3)粉体,并对制备的纳米粉体分... Bi_(2)Te_(3)基材料在室温附近具有良好的热电性能,通过掺杂和纳米技术可以提高Bi_(2)Te_(3)基热电材料的热电性能,其主要由热电优值(ZT)决定.本文通过水热法成功制备了具有纳米花形貌的Lu_(x)Bi_(2-x)Te_(3)粉体,并对制备的纳米粉体分别进行XRD和SEM表征,讨论了Lu元素掺杂和乙二胺四乙酸(EDTA)用量对Lu_(x)Bi_(2-x)Te_(3)纳米花粉体形貌的影响,结果表明:Lu元素掺杂不利于纳米花形貌的形成,而EDTA用量的合适选取对于纳米花形貌的形成起着至关重要的作用.接着采用热压法将Lu_(x)Bi_(2-x)Te_(3)纳米花粉体压制成致密块体,讨论了Lu元素掺杂对Lu_(x)Bi_(2-x)Te_(3)块体热电性能的影响,结果表明:Lu掺杂和纳米花形貌有利于提高样品的功率因子同时保持较低的热导率,从而可以达到较高的ZT值;Lu_(0.2)Bi_(1.8)Te_(3)样品和Lu_(0.25)Bi_(1.75)Te_(3)样品的ZT值均高于区域熔炼商用Bi_(2)Te_(3)块体的值,并且Lu_(0.25)Bi_(1.75)Te_(3)样品的ZT值在测温范围内均高于1,其ZT值在473 K时达到了1.14,高于其他相关报道的n型块体的值.这一研究为提高Bi_(2)Te_(3)基合金热电材料的热电性能提供了一个新的途径. 展开更多
关键词 lu_(x)bi_(2-x)te_(3)粉体 lu元素掺杂 EDTA用量 纳米花形貌 热电性能
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拓扑绝缘体(Bi_(1-x)Sb_(x))_(2)Te_(3)薄膜制备及其电输运性能研究
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作者 张哲瑞 仇怀利 +3 位作者 周同 黄文宇 葛威锋 杨远俊 《合肥工业大学学报(自然科学版)》 CAS 北大核心 2023年第11期1580-1584,共5页
文章利用分子束外延(molecular beam epitaxy, MBE)法,在超高真空的条件下,于蓝宝石衬底上制备超薄的高质量拓扑绝缘体(Bi_(1-x)Sb_(x))_(2)Te_(3)薄膜。利用反射高能电子衍射(reflection high-energy electron diffraction, RHEED)仪、... 文章利用分子束外延(molecular beam epitaxy, MBE)法,在超高真空的条件下,于蓝宝石衬底上制备超薄的高质量拓扑绝缘体(Bi_(1-x)Sb_(x))_(2)Te_(3)薄膜。利用反射高能电子衍射(reflection high-energy electron diffraction, RHEED)仪、X射线衍射(X-ray diffraction, XRD)仪、显微共焦激光拉曼光谱仪(micro confocal laser Raman spectrometer)和X射线光电子能谱(X-ray photoelectron spectroscopy, XPS)仪对不同Sb掺杂量的样品进行表征,并获得最佳的制备参数。研究结果表明:衬底温度为460℃时Bi和Te的流量比为1∶16左右;在Sb温度为350、360、370、380℃时,可以制得高质量的(Bi_(1-x)Sb_(x))_(2)Te_(3)薄膜。利用霍尔效应测量系统测量样品的电阻率、霍尔系数、迁移率和载流子浓度;测量结果表明,(Bi_(1-x)Sb_(x))_(2)Te_(3)薄膜的载流子浓度和主要载流子类型随x的变化而发生相应的变化,并伴随着费米能级位置的调谐,随着x的增加,在x=0.53到x=0.68的掺杂过程中,费米能级从导带下移到带隙,最终进入价带,多数载流子类型也从自由电子转变成空穴,(Bi_(1-x)Sb_(x))_(2)Te_(3)实现了从n型到p型的转化。 展开更多
关键词 分子束外延(MBE) 拓扑绝缘体 (bi_(1-x)Sb_(x))_(2)te_(3)薄膜 霍尔系数 载流子迁移率
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Identification and characterization of single crystal Bi_(2)Te_(3-x)Se_(x) alloy 被引量:1
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作者 Emina POZEGA Svetlana IVANOV +4 位作者 Zoran STEVIC Ljiljana KARANOVIC Rudolf TOMANEC Lidija GOMIDZELOVIC Ana KOSTOV 《Transactions of Nonferrous Metals Society of China》 SCIE EI CAS CSCD 2015年第10期3279-3285,共7页
The results of experimental investigation of n-type semiconductor based on Bi2Te3 alloy were presented. This material is used in manufacture of thermoelectric coolers and electrical power generation devices. BizTe2.88... The results of experimental investigation of n-type semiconductor based on Bi2Te3 alloy were presented. This material is used in manufacture of thermoelectric coolers and electrical power generation devices. BizTe2.88Se0.12 solid solution single crystal has been grown using the Czochralski method. Monitoring of structure changes of the sample was carried out by electron microscope. The elemental composition of the studied alloy was obtained by energy dispersive spectrometry (EDS) analysis and empirical formula of the compound was established. X-ray diffraction analysis confirmed that the Bi2Te2.88Se0.12 sample was a single phase with rhombohedral structure. The behavior upon heating was studied using differential thermal analysis (DTA) technique. Changes in physical and chemical properties of materials were measured as a function of increasing temperature by thermogravimetric analysis (TGA). The lattice parameters values obtained by X-ray powder diffraction analyses of Bi2Te2.88Se0.12 are very similar to BizTe3 lattice constants, indicating that a small portion of tellurium is replaced with selenium. The obtained values for specific electrical and thermal conductivities are in correlation with available literature data. The Vickers microhardness values are in range between HV 187 and HV 39.02 and decrease with load increasing. It is shown that very complex process of infrared thermography can be applied for characterization of thermoelectric elements and modules. 展开更多
关键词 bi_(2)te_(3) bi_(2)te_(3-x)Se_(x) single crystal semiconductor thermoelectrical properties hardness thermovision imaging
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