A Radial Stub Test Circuit for Microwave Power Devices

With the principles of microwave circuits and semiconductor device physics, two microwave power device test circuits combined with a test fixture are designed and simulated, whose properties are evaluated by a parameter network analyzer within the frequency range from 3 to 8GHz. The simulation and experimental results verify that the test circuit with a radial stub is better than that without. As an example, a C-band AlGaN/GaN HEMT microwave power device is tested with the designed circuit and fixture. With a 5.4GHz microwave input signal,the maximum gain is 8.75dB,and the maximum output power is 33.2dBm.

Test system of the front-end readout for an application-specific integrated circuit for the water Cherenkov detector array at the large high-altitude air shower observatory

The water Cherenkov detector array(WCDA) is an important part of the large high-altitude air shower observatory(LHAASO),which is in a research and development phase.The central scientific goal of LHAASO is to explore the origin of high-energy cosmic rays of the universe and to push forward the frontier of new physics.To simplify the WCDA's readout electronics,a prototype of a front-end readout for an application-specific integrated circuit(ASIC) is designed based on the timeover-threshold method to achieve charge-to-time conversion.High-precision time measurement and charge measurement are necessary over a full dynamic range[1-4000photoelectrons(P.E.)].To evaluate the performance of this ASIC,a test system is designed that includes the front-end ASIC test module,digitization module,and test software.The first module needs to be customized for different ASIC versions,whereas the digitization module and test software are tested for general-purpose use.In the digitization module,a field programmable gate array-based time-todigital converter is designed with a bin size of 333 ps,which also integrates an inter-integrated circuit to configure the ASIC test module,and a universal serial bus interface is designed to transfer data to the remote computer.Test results indicate that the time resolution is better than 0.5 ns,and the charge resolution is better than 30%root mean square(RMS) at 1 P.E.and 3%RMS at 4000 P.E.,which are beyond the application requirements.

Research on the overload protection reliability of moulded case circuit-breakers and its test device

This paper analyzed the reliability and put forward the reliability index of overload protection for moulded case circuit breaker. The success rate was adopted as its reliability index of overload protection. Based on the reliability index and the reli- ability level, the reliability examination plan was analyzed and a test device for the overload protection of moulded case cir- cuit-breaker was developed. In the reliability test of overload protection, two power sources were used, which reduced the time of conversion and regulation between two different test currents in the overload protection test, which made the characteristic test more accurate. The test device was designed on the base of a Windows system, which made its operation simple and friendly.

Investigation into Equivalency of Synthetic Test Circuit Used for Operational Tests of Thyristor Valves for UHVDC

With the growth of capacity of high voltage direct current(HVDC) transmission lines,the ratings of thyristor valves,which are one of the most critical equipments,are getting higher and higher.Verification of performance of thyristor valves particularly designed for HVDC project plays an important role in the handover of products between the manufacturer and the client.Conventional test facilities based on philosophy of direct test cannot meet the requirements for modern thyristor valves.New test facilities with high ratings are necessarily built based on philosophy of synthetic test.Over the conventional direct test circuit,the later is an economical and feasible solution with less financial investment and higher test capability.However,the equivalency between the synthetic test and the direct test should be analyzed technically in order to make sure that the condition of verification test in a synthetic test circuit should satisfy the actual operation condition of thyristor valves existing in a real HVDC project,just as in a direct test circuit.Equivalency analysis is focused in this paper,covering the scope of thyristor valves' steady state,and transient state.On the basis of the results achieved,a synthetic test circuit of 6 500 A/50 kV for operational tests of thyristor valves used for up to UHVDC project has newly been set up and already put into service in Xi'an High Voltage Apparatus Research Institute Co.,Ltd.(XIHARI),China.Some of the results have been adopted also by a new national standard of China.

VST/DL Digital Circuit Testing & Analytical System

An important means for digital circuit analysis, design. maintenance and production is the IC chip test and analysis. With digital circuit application prevailing today, the automatic test and analysis of digital circuits is going to play a more important role. It can save a great deal of time and cost for the maintenance of equipment and can also provide correst analytical data for designers.

The embedded design verification test of microwave circuit modules based on specific chips

In the Paper,the author introduces an embedded design verification test based on specific chips to solve the technical problems of microwave circuit test and fault diagnosis.The author explains embedded design of microwave circuit modules and approach of hardware design and software design,and finally verifies the embedded design of microwave circuit modules based on specific chips.

The Transformer Short-Circuit Test and the High Power Laboratory in China-the Past,Present,and Future

We review the short-circuit testing of distribution and power transformers, and include a list of 110-220kV power transformers tested up to February 2002.

Random testing for system-level functional verification of system-on-chip

In order to deal with the limitations during the register transfer level verification, a new functional verification method based on the random testing for the system-level of system-on-chip is proposed.The validity of this method is proven theoretically.Specifically, testcases are generated according to many approaches of randomization.Moreover, the testbench for the system-level verification according to the proposed method is designed by using advanced modeling language.Therefore, under the circumstances that the testbench generates testcases quickly, the hardware/software co-simulation and co-verification can be implemented and the hardware/software partitioning planning can be evaluated easily.The comparison method is put to use in the evaluation approach of the testing validity.The evaluation result indicates that the efficiency of the partition testing is better than that of the random testing only when one or more subdomains are covered over with the area of errors, although the efficiency of the random testing is generally better than that of the partition testing.The experimental result indicates that this method has a good performance in the functional coverage and the cost of testing and can discover the functional errors as soon as possible.

Simulation and Experimental Analysis of Arc Motion Characteristics in Air Circuit Breaker

In this paper, to simulate the arc motion in an air circuit breaker （ACB）, a three- dimensional magneto-hydrodynamic （MHD） model is developed, considering the influence of ther- mal radiation, the change of physical parameters of arc plasma and the nonlinear characteristic of ferromagnetic material. The distributions of pressure, temperature, gas flow and current density of arc plasma in the arc region are calculated. The simulation results show some phenomena which discourage arc interruption, such as back commutation and arc burning at the back of the splitter plate. To verify the simulation model, the arc motion is studied experimentally. The influences of the material and position of the innermost barrier plate are analyzed mainly. It proved that the model developed in this paper can efficiently simulate the arc motion. The results indicate that the insulation barrier plate close to the top of the splitter plate is conducive to the arc splitting, which leads to the significant increase of the arc voltage, so it is better for arc interruption. The research can provide methods and references to the optimization of ACB design.

An optimal stacking order for mid-bond testing cost reduction of 3D IC

In order to solve the problem that the testing cost of the three-dimensional integrated circuit(3D IC)is too high,an optimal stacking order scheme is proposed to reduce the mid-bond test cost.A new testing model is built with the general consideration of both the test time for automatic test equipment(ATE)and manufacturing failure factors.An algorithm for testing cost and testing order optimization is proposed,and the minimum testing cost and optimized stacking order can be carried out by taking testing bandwidth and testing power as constraints.To prove the influence of the optimal stacking order on testing costs,two baselines stacked in sequential either in pyramid type or in inverted pyramid type are compared.Based on the benchmarks from ITC 02,experimental results show that for a 5-layer 3D IC,under different constraints,the optimal stacking order can reduce the test costs on average by 13%and 62%,respectively,compared to the pyramid type and inverted pyramid type.Furthermore,with the increase of the stack size,the test costs of the optimized stack order can be decreased.

Key stress extraction and equivalent test method for hybrid DC circuit breaker

Firstly, relevant stress properties of millisecond level breaking process and microsecond level commutation process of hybrid HVDC circuit breaker are studied in detail on the basis of the analysis for the application environment and topological structure and operating principles of hybrid circuit breakers, and key stress parameters in transient state process of two time dimensions are extracted. The established digital simulation circuit for PSCAD/EMTDC device-level operation of the circuit breaker has verified the stress properties of millisecond level breaking process and microsecond level commutation process. Then, equivalent test method, circuits and parameters based on LC power supply are proposed on the basis of stress extraction. Finally, the results of implemented breaking tests for complete 200 kV circuit breaker, 100 kV and 50 kV circuit breaker units, as well as single power electronic module have verified the accuracy of the simulation circuit and mathematical analysis. The result of this paper can be a guide to electrical structure and test system design of hybrid HVDC circuit breaker.

Human blood plasma-based electronic integrated circuit amplifier configuration

Dear Editor： There is accumulating evidence that human blood electronic circuit components and their application circuits become more and more important to cyborg implant/engineering, man-machine interface, hu- man disease detection and healing, and artificial brain evolutionusl. Here, we report the first development of human plasma-based amplifier circuit in the dis- crete as well as integrated circuit （IC） configuration mode. Electrolytes in the human blood contain an enormous number of charge carriers such as positive and negative molecule/atom ions, which are electri- cally conducting media and therefore can be utilized for developing electronic circuit components and their application circuits. These electronic circuits obvi- ously have very high application impact potential towards bio-medical engineering and medical science and technology.

Vacuum Dielectric Recovery Characteristics of a Novel Current Limiting Circuit Breaker Base on Artificial Current Zero

为了保证新型强迫换流型真空直流限流断路器关断短路电流的可靠性，对该型断路器分断过程的真空介质恢复特性进行研究。设计了与断路器关断过程等效的介质恢复试验方案，通过等效试验结果和理论推演公式的拟合，得到了新型强迫换流型限流断路器真空灭弧室触头打开过程的动态介质强度恢复规律。研究结果表明：减小燃弧能量、提高触头运动速度可提高真空灭弧室介质的临界击穿电压；综合考虑燃弧时间与燃弧能量及触头开距的关系，随着燃弧时间的增加，真空灭弧室临界击穿电压先减小后增大。所得介质恢复规律可以作为新型断路器优化设计的参考依据。

Influence of Tilted Angle on Effective Linear Energy Transfer in Single Event Effect Tests for Integrated Circuits at 130 nm Technology Node

A heavy-ion irradiation experiment is studied in digital storage cells with different design approaches in 130？nm CMOS bulk Si and silicon-on-insulator （SOI） technologies. The effectiveness of linear energy transfer （LET） with a tilted ion beam at the 130？nm technology node is obtained. Tests of tilted angles θ=0 ° , 30 ° and 60 ° with respect to the normal direction are performed under heavy-ion Kr with certain power whose LET is about 40？MeVcm 2 /mg at normal incidence. Error numbers in D flip-flop chains are used to determine their upset sensitivity at different incidence angles. It is indicated that the effective LETs for SOI and bulk Si are not exactly in inverse proportion to cosθ , furthermore the effective LET for SOI is more closely in inverse proportion to cosθ compared to bulk Si, which are also the well known behavior. It is interesting that, if we design the sample in the dual interlocked storage cell approach, the effective LET in bulk Si will look like inversely proportional to cosθ very well, which is also specifically explained.

Model Test Study of Dynamic Ice Force on Compliant Conical Structures

To study ice-induced vibration of a compliant conical structure, a series of model tests were performed from 2004 to 2005. In the tests, the ice sheet before the compliant conical structure was found to fail in two-time breaking. From 2005 to 2006, this type of ice failure was studied through more groups of tests. The tests show that two-time breaking is the typical failure of ice before steep conical structures, and is controlled by other factors at the same time, such as ice speed and the angle of the cone.

Model Test Study on Ice Induced Vibration of A Compliant Conical Structure

The problem of ice induced vibration is common to ocean engineering of cold region countries. To study the ice induced vibration of a compliant conical structure, a series of model tests have been performed and some breakthrough progresses made. The ice sheet before the compliant conical structure is found to fail by two-time breaking in the tests. The process of two-time breaking behaves in two modes, and the general control of the ice and structural conditions determine the mode in which the ice force would behave. Two dynamic ice force functions are established respectively for the two modes of two-time breaking process in this paper. The numerical simulation results are in good agreement with the measured results, indicating that the dynamic ice force functions given in this paper can fully reflect the real situation of the dynamic ice force on a compliant conical structure.

Model Test Study on Ice-Induced Vibrations of Compliant Multi-Cone Structures

For the study on the ice-induced vibration of a compliant mono-cone structure,a series of model tests were performed from 2004 to 2006.In these tests,the ice sheet before the compliant conical structure was found to be failed in two-time breaking.Based on this important finding,model tests study of the ice force on a compliant multi-cone structure were performed from 2006 to 2007.In these tests,the ice sheet broke before each single cone non-simultaneously.The exciting energy of the total ice force was found to be in a wide range of frequencies,and the structure can be easily excited with nonlinear resonance.

STUDY ON MAXIMUM SPECIFIC SLUDGE ACTIVITY OF DIFFERENT ANAEROBIC GRANULAR SLUDGE BY BATCH TESTS

The maximum specific sludge activity of granular sludge from large scale UASB, IC and Biobed anaerobic reactors were investigated by batch tests. The limitation factors related to maximum specific sludge activity (diffusion, substrate sort, substrate concentration and granular size) were studied. The general principle and procedure for the precise measurement of maximum specific sludge activity were suggested. The potential capacity of loading rate of the IC and Biobed anaerobic reactors were analyzed and compared by use of the batch tests results.

Dynamical analysis,circuit realization,and application in pseudorandom number generators of a fractional-order laser chaotic system

A new five-dimensional fractional-order laser chaotic system(FOLCS)is constructed by incorporating complex variables and fractional calculus into a Lorentz-Haken-type laser system.Dynamical behavior of the system,circuit realization and application in pseudorandom number generators are studied.Many types of multi-stable states are discovered in the system.Interestingly,there are two types of state transition phenomena in the system,one is the chaotic state degenerates to a periodical state,and the other is the intermittent chaotic oscillation.In addition,the complexity of the system when two parameters change simultaneously is measured by the spectral entropy algorithm.Moreover,a digital circuit is design and the chaotic oscillation behaviors of the system are verified on this circuit.Finally,a pseudo-random sequence generator is designed using the FOLCS,and the statistical characteristics of the generated pseudo-random sequence are tested with the NIST-800-22.This study enriches the research on the dynamics and applications of FOLCS.

Research of the test generation algorithm based on search state dominance for combinational circuit

On the basis of EST (Equivalent STate hashing) algorithm, this paper researches a kind of test generation algorithm based on search state dominance for combinational circuit. According to the dominance relation of the E-frontier (evaluation frontier), we can prove that this algorithm can terminate unnecessary searching step of test pattern earlier than the EST algorithm through some examples, so this algorithm can reduce the time of test generation. The test patterns calculated can detect faults given through simulation.