现有几何光学方法的二向反射分布函数BRDF(bidirectional reflection distribution function)模型在计算阴影遮蔽效应时普遍应用Blinn几何衰减效应假设,其等倾角V形槽近似得出的分段折线形式的几何衰减因子导致BRDF曲线存在较大的误差....现有几何光学方法的二向反射分布函数BRDF(bidirectional reflection distribution function)模型在计算阴影遮蔽效应时普遍应用Blinn几何衰减效应假设,其等倾角V形槽近似得出的分段折线形式的几何衰减因子导致BRDF曲线存在较大的误差.基于倾斜角随机高斯分布的微面元理论提出了一种新的几何衰减模型,得出了积分形式的几何衰减因子表达式,数值模拟比较了Blinn几何衰减因子与修正后的积分型衰减因子以及对应的BRDF模型曲线.结果表明:提出的几何衰减因子在物理合理性以及模拟精度方面都有明显提升,使BRDF模型曲线与已有BRDF数据之间的标准误差由0.0636减小到0.0084.展开更多
This paper proposes a lightweight bidirectional scattering distribution function(BSDF)model for layered materials with anisotropic reflection and refraction properties.In our method,each layer of the materials can be ...This paper proposes a lightweight bidirectional scattering distribution function(BSDF)model for layered materials with anisotropic reflection and refraction properties.In our method,each layer of the materials can be described by a microfacet BSDF using an anisotropic normal distribution function(NDF).Furthermore,the NDFs of layers can be defined on tangent vector fields,which differ from layer to layer.Our method is based on a previous study in which isotropic BSDFs are approximated by projecting them onto base planes.However,the adequateness of this previous work has not been well investigated for anisotropic BSDFs.In this paper,we demonstrate that the projection is also applicable to anisotropic BSDFs and that the BSDFs are approximated by elliptical distributions using covariance matrices.展开更多
文摘现有几何光学方法的二向反射分布函数BRDF(bidirectional reflection distribution function)模型在计算阴影遮蔽效应时普遍应用Blinn几何衰减效应假设,其等倾角V形槽近似得出的分段折线形式的几何衰减因子导致BRDF曲线存在较大的误差.基于倾斜角随机高斯分布的微面元理论提出了一种新的几何衰减模型,得出了积分形式的几何衰减因子表达式,数值模拟比较了Blinn几何衰减因子与修正后的积分型衰减因子以及对应的BRDF模型曲线.结果表明:提出的几何衰减因子在物理合理性以及模拟精度方面都有明显提升,使BRDF模型曲线与已有BRDF数据之间的标准误差由0.0636减小到0.0084.
基金supported by the JST ACCEL(JPMJAC1602)JSPS KAKENHI(JP17H06101,18K18075,and JP19H01129).
文摘This paper proposes a lightweight bidirectional scattering distribution function(BSDF)model for layered materials with anisotropic reflection and refraction properties.In our method,each layer of the materials can be described by a microfacet BSDF using an anisotropic normal distribution function(NDF).Furthermore,the NDFs of layers can be defined on tangent vector fields,which differ from layer to layer.Our method is based on a previous study in which isotropic BSDFs are approximated by projecting them onto base planes.However,the adequateness of this previous work has not been well investigated for anisotropic BSDFs.In this paper,we demonstrate that the projection is also applicable to anisotropic BSDFs and that the BSDFs are approximated by elliptical distributions using covariance matrices.