A 1.5 bit/s Pipelined Analog-to-Digital Converter Design with Independency of Capacitor Mismatch

A new technique which is named charge temporary storage technique (CTST) was presented to improve the linearity of a 1.5 bit/s pipelined analog-to-digital converter (ADC). The residual voltage was obtained from the sampling capacitor, and the other capacitor was just a temporary storage of charge. Then, the linearity produced by the mismatch of these capacitors was eliminated without adding extra capacitor error-averaging amplifiers. The simulation results confirmed the high linearity and low dissipation of pipelined ADCs implemented in CTST, so CTST was a new method to implement high resolution, small size ADCs.

A 12-bit 250-MS/s Charge-Domain Pipelined Analog-to-Digital Converter with Feed-Forward Common-Mode Charge Control

A feed-forward Common-Mode （CM） charge control circuit for a high-speed Charge-Domain （CO） pipelined Analog-to-Digital Converter （ADC） is presented herein. This study aims at solving the problem whereby the precision of CD pipelined ADCs is restricted by the variation in input CM charge, which can compensate for CM charge errors caused by a variation in CM charge input in real time. Based on the feed-forward CM charge control circuit, a 12-bit 250-MS/s CD pipelined ADC is designed and realized using a 1P6M 0.18-μm CMOS process. The ADC achieved a Spurious Free Dynamic Range （SFDR） of 78.1 dB and a Signal-to-Noise-and-Distortion Ratio （SNDR） of 64.6 dB for a 20.1-MHz input; a SFDR of 74.9 dB and SNDR of 62.0 dB were achieved for a 239.9-MHz input at full sampling rate. The variation in signal-to-noise ratio was less than 3 dB over a 0-1.2 V input CM voltage range. The power consumption of the prototype ADC is only 85 mW at 1.8 V supply, and it occupies an active die area of 2.24 mm^2.

A 5MS/s 12-Bit Successive Approximation Analog-to-Digital Converter

With the continuous development of science and technology, digital signal processing is more and more widely used in various fields. Among them, the analog-to-digital converter (ADC) is one of the key components to convert analog signals to digital signals. As a common type of ADC, 12-bit sequential approximation analog-to-digital converter (SAR ADC) has attracted extensive attention for its performance and application. This paper aims to conduct in-depth research and analysis of 12-bit SAR ADC to meet the growing demands of digital signal processing. This article designs a 12-bit, successive approximation analog-to-digital converter (SAR ADC) with a sampling rate of 5 MS/s. The overall circuit adopts a fully differential structure, with key modules including DAC capacitor array, comparator, and control logic. According to the DAC circuit in this paper, a fully differential capacitor DAC array structure is proposed to reduce the area of layout DAC. The comparator uses a digital dynamic comparator to improve the ADC conversion speed. The chip is designed based on the SMIC180 nm CMOS process. The simulation results show that when the sampling rate is 5 MS/s, the effective bit of SAR ADC is 11.92 bit, the SNR is 74.62 dB, and the SFDR is 89.24 dB.

A 1.8V 10bit 100Msps Pipelined Analog to Digital Converter

A novel low-voltage,low constant-impedance switch is proposed, which not only eliminates the parasitic capacitor but also reduces the variation of switch ＂on＂ resistance. With the gain-boost technology,the operational transconductance amplifier used in this analog-to-digital converter （ADC） achieves enough DC gain and unity-gain frequency under the low voltage supply and to guarantee the performance of the sample and hold circuit （S/H） and the sub-stages. Based on these methods,a 10bit 100Msps pipelined ADC is fabricated in a 0. 18μm CMOS process and operates under a 1.8V voltage supply. The ADC achieves an SNR of 54. 2dB （input frequency of 6.26MHz） and an SNR of 49. 8dB （input frequency of 48. 96MHz） when the sampling frequency is 100MHz.

Mismatch Calibration Techniques in Successive Approximation Analog-to-Digital Converters

Comparator offset cancellation and capacitor self-calibration techniques used in a successive approximation analog-to-digital converter （SA-ADC） are described. The calibration circuit works in parallel with the SAADC by adding additional calibration clock cycles to pursue high accuracy and low power consumption, and the calibrated resolution can be up to 14bit. This circuit is used in a 10bit 3Msps successive approximation ADC. This chip is realized with an SMIC 0. 18μm 1.8V process and occupies 0.25mm^2 . It consumes 3. 1mW when operating at 1.8MHz. The measured SINAD is 55. 9068dB, SFDR is 64. 5767dB, and THD is - 74. 8889dB when sampling a 320kHz sine wave.

Overview of Energy-Efficient Successive-Approximation Analog-to-Digital Converters: State-of-the-Art and a Design Example

This paper makes a review of state-of-the- arts designs of successive-approximation register analog-to-digital converters （SAR ADCs）. Methods and technique specifications are collected in view of innovative ideas. At the end of this paper, a design example is given to illustrate the procedure to design an SAR ADC. A new method, which extends the width of the internal clock, is also proposed to facilitate different sampling frequencies, which provides more time for the digital-to-analog convert （DAC） and comparator to settle. The 10 bit ADC is simulated in 0.13 μm CMOS process technology. The signal-to-noise and distortion ratio （SNDR） is 54.41 dB at a 10 MHz input with a 50 MS/s sampling rate, and the power is 330 μW.

Effect of ionizing radiation on dual 8-bit analog-to-digital converters (AD9058) with various dose rates and bias conditions

The radiation effects on several properties （reference voltage, digital output logic voltage, and supply current） of dual 8-bit analog-to-digital （A/D） converters （AD9058） under various biased conditions are investigated in this paper. Gamma ray and 10-MeV proton irradiation are selected for a detailed evaluation and comparison. Based on the measurement results induced by the gamma ray with various dose rates, the devices exhibit enhanced low dose rate sensitivity （ELDRS） under zero and working bias conditions. Meanwhile, it is obvious that the ELDRS is more severe under the working bias condition than under the zero bias condition. The degradation of AD9058 does not display obvious ELDRS during 10-MeV proton irradiation with the selected flux.

Novel Optical Analog-To-Digital Converter Based on Optical Time Division Multiplexing

A novel optical analog-to-digital converter based on optical time division multiplexing(OTDM) is described which uses electrooptic sampling and time-demultiplexing together with multiple electronic analog-to-digital converter(ADC). Compared with the previous scheme, the time-division multiplexer and the time-division demultiplexer are applied in the optical analog-to-digital converter(OADC) at the same time, the design of the OADC is simplified and the performance of the OADC based on time-division demultiplexer is improved. A core optical part of the system is demonstrated with a sample rate of 10 Gs/s. The signals in three channels are demultiplexed from the optical pulses.The result proves our scheme is feasible.

An 85mW 14-bit 150MS/s Pipelined ADC with a Merged First and Second MDAC

A low-power 14-bit 150MS/s an- alog-to-digital converter （ADC） is present- ed for communication applications. Range scaling enables a maximal 2-Vp-p input with a single-stage opamp adopted. Opamp and capacitor sharing between the first multi- plying digital-to-analog converter （MDAC） and the second one reduces the total opamp power further. The dedicated sample-and- hold amplifier （SHA） is removed to lower the power and the noise. The blind calibration of linearity errors is proposed to improve the per- formance. The prototype ADC is fabricated in a 130rim CMOS process with a 1.3-V supply voltage. The SNDR of the ADC is 71.3 dB with a 2.4 MHz input and remains 68.5 dB for a 120 MHz input. It consumes 85 roW, which includes 57 mW for the ADC core, 11 mW for the low jitter clock receiver and 17 mW for the high-speed reference buffer.

A 71mW 8b 125MSample/s A/D Converter

A 1.8V 8b 125Msample/s pipelined A/D converter is presented.Power efficiency is optimized by size scaling down scheme using low power single stage cascode amplifier with a gain boosted structure.Global clock tree and local generators are employed to avoid loss and overlap of clock period.The ADC achieves a signal-to-noise-and-distortion ratio (SNDR) of 49.5dB(7.9ENOB) for an input of 62MHz at full speed of 125MHz,consuming only 71mW.It is implemented in 0.18μm CMOS technology with a core area of 0.45mm 2.

A 59mW 10b 40Msample/s Pipelined ADC

This paper describes a 3.0V, 10b,40Msample/s analog-to-digital converter （ADC） fabricated in a 0.25μm CMOS technology. Through the sharing an amplifier between two successive pipeline stages, the converter is realized using just four amplifiers with a separate sample-and-hold block. It employs two key techniques： a high bandwidth low-power gain-boosting telescopic amplifiers technique and a low power low offset dynamic comparators technique.The ADC achieves a 8.1 effective number of bits,a maximum differential nonlinearity of a 0.85 least significant bit（LSB）, and maximum integral nonlinearity of 2.2LSB for a 0.5MHz input at full sampling rate. It occupies 1.24mm^2 ,which also includes a bandgap and a voltage reference circuit and dissipates only 59mW.

A High Linearity,13bit Pipelined CMOS ADC

A 13bit,pipelined analog-to-digital converter （ADC） designed to achieve high linearity is described. The high linearity is realized by using the passive capacitor error-averaging technique to calibrate the capacitor mismatch error, a gain-boosting opamp to minimize the finite gain error and gain nonlinearity,a bootstrapping switch to reduce the switch on-resistor nonlinearity, and an anti-disturb design to reduce the noise from the digital supply. This ADC is implemented in 0.18μm CMOS technology and occupies a die area of 3.2mm^2 , including pads. Measured performance includes - 0.18/ 0.15LSB of differential nonlinearity, -0.35/0.5LSB of integral nonlinearity, 75.7dB of signal-to-noise plus distortion ratio （SNDR） and 90. 5 dBc of spurious-free dynamic range （SFDR） for 2.4MHz input at 2.5MS/s. At full speed conversion （5MS/s） and for the same 2.4MHz input, the measured SNDR and SFDR are 73.7dB and 83.9 dBc, respectively. The power dissipation including output pad drivers is 21mW at 2.5MS/s and 34mW at 5MS/s,both at 2.7V supply.

200Ms/s 177mW 8bit Folding and Interpolating CMOS A/D Converter

A CMOS folding and interpolating analog-to-digital converter (ADC) for embedded application is described.The circuit is fully compatible with standard digital CMOS technology.A modified folding block implemented without resistor contributes to a small chip area.At the input stage,offset averaging reduces the input capacitance and the distributed track-and-hold circuits are proposed to improve signal-to-noise-plus-distortion ratio.The 200Ms/s 8bit ADC with 177mW total power consumption at 3.3V power supply is realized in standard digital 0.18μm 3.3V CMOS technology.

PIPELINED多值A/D转换器

通过对多值ADC数学表示的分析，指出了多值ADC具有更高的信息密度。本文结合数字电路的开关信号理论，设计了Pipelined三值ADC。该ADC在保证较高转换速度的同时具有相对简单的电路结构。

A FAST FOREGROUND DIGITAL CALIBRATION TECHNIQUE FOR PIPELINED ADC

Digital calibration techniques are widely developed to cancel the non-idealities of the pipelined Analog-to-Digital Converters (ADCs). This letter presents a fast foreground digital calibration technique based on the analysis of error sources which influence the resolution of pipelined ADCs. This method estimates the gain error of the ADC prototype quickly and calibrates the ADC simultaneously in the operation time. Finally, a 10 bit, 100 Ms/s pipelined ADC is implemented and calibrated. The simulation results show that the digital calibration technique has its efficiency with fewer operation cycles.

Design of a 14-Bit 1 MS/s Successive Approximation Analog-to-Digital Converter

A 14-bit successive approximation analog-to-digital converter (SAR ADC) with capacitive calibration has been designed based on the SMIC. 18 μm CMOS process. The overall architecture is in fully differential form to eliminate the effect caused by common mode noise. Meanwhile, the digital-to-analog converter (DAC) is a two-stage structure, which can greatly reduce the area of the capacitor array compared with the traditional DAC structure. The capacitance calibration module is mainly divided into the mismatch voltage acquisition phase and the calibration code backfill phase, which effectively reduces the impact of the DAC mismatch on the accuracy of the SAR ADC. The design of this paper is based on cadence platform simulation verification, simulation results show that when the sampling rate is 1 MS/s, the power supply voltage is 5 V and the reference voltage is 4.096 V, the effective number of bits (ENOB) of the ADC is 13.49 bit, and the signal-to-noise ratio (SNR) is 83.3 dB.

Design of Pipelined ADC Using Op Amp Sharing Technique

This paper presents a 10-bit 20 MS/s pipelined Analog-to- Digital Converter（ADC） using op amp sharing approach and removing Sample and Hold Amplifier（SHA） or SHA-less technique to reach the goal of low-power constanpfion. This design was fabricated in TSMC 0.18 wn 1P6M technology. Measurement results show at supply voltage of 1.8 V, a SFDR of 42.46 dB, a SNDR of 39.45 dB, an ENOB of 6.26, and a THDof41.82 dB are at 1 MHz sinusoidal sig- nal input. In addition, the DNL and INL are 1.4 LSB and 3.23 LSB respectively. The power onstmaption is 28.8 mW. The core area is 0.595 mm2 and the chip area including pads is 1.468 mm2.

Analog-to-digital conversion of information in the retina

We considered the physiological mechanisms of functioning of the retina’s neural network. It is marked that the primary function of a neural network is an analog-to-digital conversion of the receptor potential of photoreceptor into the pulse-to-digital signal to ganglion cells. We showed the role of different types of neurons in the work of analog-to-digital converter. We gave the equivalent circuit of this converter. We researched the mechanism of the numeric coding of the receptor potential of the photoreceptor.

DIGITAL BACKGROUND CALIBRATION OF CAPACITOR MISMATCHES AND HARMONIC DISTORTION IN PIPELINED ADC

A correlation-based digital background calibration algorithm for pipelined Analog-to- Digital Converters (ADCs) is presented in this paper. The merit of the calibration algorithm is that the main errors information, which include the capacitor mismatches and residue amplifier distortion, are extracted integrally. A modified 1st pipelined stage is adopted to solve the signal overflow caused by the Pseudo-random Noise (PN) sequences. Behavioral simulation results verify the effectiveness of the algorithm. It improves the Signal-to-Noise-plus-Distortion Ratio (SNDR) and Spurious-Free-Dynamic-Range (SFDR) of the pipelined ADC from 41.8 dB to 78.3 dB and 55.6 dB to 98.6 dB, respectively, which is comparable to the prior arts.

基于时钟抖动流水线结构的高效率真随机数发生器

现代加密系统对密钥随机性的需求不断增加。使用时序抖动、热噪声、亚稳态等作为熵源的真随机数发生器,因其可以提供高质量的随机性成为该领域的研究热点。因此,提出一种可配置、轻量级、高效率的真随机数发生器。该发生器使用基于随机数学模型的设计方法,由差分构架的两级时钟抖动流水线组成。第一级流水线中两个环形振荡器在规定时间内累积抖动,第二级流水线利用近似相同的两个环形振荡器的微小周期差构建时间数字转换器,对第一级输出的高斯抖动进行量化,通过数字化模块输出随机比特。在时间数字转换器运行过程中,第一级流水线已经重新启动累积下一个阶段的抖动,减少了空闲时间,提高了真随机数的质量和效率。在Xilinx Atrix-7平台进行了验证,该结构的硬件资源仅消耗了25个LUTs和13个DFFs,获得高达32.55 Mb/s的吞吐量。