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Improving contrast and sectioning power in confocal imaging by third harmonic generation in SiOx nanocrystallites 被引量:1
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作者 Gilbert Boyer Karsten Plamann 《Chinese Optics Letters》 SCIE EI CAS CSCD 2007年第8期477-479,共3页
We present a new optical microscope in which the light transmitted by a sample-scanned transmission confocal microscope is frequency-tripled by SiOx nanocrystallites in lieu of being transmitted by a confocal pinhole.... We present a new optical microscope in which the light transmitted by a sample-scanned transmission confocal microscope is frequency-tripled by SiOx nanocrystallites in lieu of being transmitted by a confocal pinhole. This imaging technique offers an increased contrast and a high scattered light rejection. It is demonstrated that the contrast close to the Sparrow resolution limit is enhanced and the sectioning power are increased with respect to the linear confocal detection mode. An experimental implementation is presented and compared with the conventional linear confocal mode. 展开更多
关键词 mode Improving contrast and sectioning power in confocal imaging by third harmonic generation in SiO_x nanocrystallites THG
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