Test data compression and test resource partitioning (TRP) are essential to reduce the amount of test data in system-on-chip testing. A novel variable-to-variable-length compression codes is designed as advanced fre...Test data compression and test resource partitioning (TRP) are essential to reduce the amount of test data in system-on-chip testing. A novel variable-to-variable-length compression codes is designed as advanced fre- quency-directed run-length (AFDR) codes. Different [rom frequency-directed run-length (FDR) codes, AFDR encodes both 0- and 1-runs and uses the same codes to the equal length runs. It also modifies the codes for 00 and 11 to improve the compression performance. Experimental results for ISCAS 89 benchmark circuits show that AFDR codes achieve higher compression ratio than FDR and other compression codes.展开更多
In order to deal with the limitations during the register transfer level verification, a new functional verification method based on the random testing for the system-level of system-on-chip is proposed.The validity o...In order to deal with the limitations during the register transfer level verification, a new functional verification method based on the random testing for the system-level of system-on-chip is proposed.The validity of this method is proven theoretically.Specifically, testcases are generated according to many approaches of randomization.Moreover, the testbench for the system-level verification according to the proposed method is designed by using advanced modeling language.Therefore, under the circumstances that the testbench generates testcases quickly, the hardware/software co-simulation and co-verification can be implemented and the hardware/software partitioning planning can be evaluated easily.The comparison method is put to use in the evaluation approach of the testing validity.The evaluation result indicates that the efficiency of the partition testing is better than that of the random testing only when one or more subdomains are covered over with the area of errors, although the efficiency of the random testing is generally better than that of the partition testing.The experimental result indicates that this method has a good performance in the functional coverage and the cost of testing and can discover the functional errors as soon as possible.展开更多
Single-event effects(SEEs)induced by mediumenergy protons in a 28 nm system-on-chip(SoC)were investigated at the China Institute of Atomic Energy.An on-chip memory block was irradiated with 90 MeV and 70 MeV protons,r...Single-event effects(SEEs)induced by mediumenergy protons in a 28 nm system-on-chip(SoC)were investigated at the China Institute of Atomic Energy.An on-chip memory block was irradiated with 90 MeV and 70 MeV protons,respectively.Single-bit upset and multicell upset events were observed,and an uppermost number of nine upset cells were discovered in the 90 MeV proton irradiation test.The results indicate that the SEE sensitivities of the 28 nm SoC to the 90 MeV and 70 MeV protons were similar.Cosmic Ray Effects on Micro-Electronics Monte Carlo simulations were analyzed,and it demonstrates that protons can induce effects in a 28 nm SoC if their energies are greater than 1.4 MeV and that the lowest corresponding linear energy transfer was 0.142 MeV cm^2 mg^-1.The similarities and discrepancies of the SEEs induced by the 90 MeV and 70 MeV protons were analyzed.展开更多
Single event effects (SEEs) in a 28-nm system-on-chip (SoC) were assessed using heavy ion irradiations, and susceptibilities in different processor configurations with data accessing patterns were investigated. The pa...Single event effects (SEEs) in a 28-nm system-on-chip (SoC) were assessed using heavy ion irradiations, and susceptibilities in different processor configurations with data accessing patterns were investigated. The patterns included the sole processor (SP) and asymmetric multiprocessing (AMP) patterns with static and dynamic data accessing. Single event upset (SEU) cross sections in static accessing can be more than twice as high as those of the dynamic accessing, and processor configuration pattern is not a critical factor for the SEU cross sections. Cross section interval of upset events was evaluated and the soft error rates in aerospace environment were predicted for the SoC. The tests also indicated that ultra-high linear energy transfer (LET) particle can cause exception currents in the 28-nm SoC, and some even are lower than the normal case.展开更多
IEEE J.Solid-State Circuits,2019,doi:10.1109/JSSC.2018.2884349Nonvolatile processor(NVP)is promising for energy-harvesting-powered internet-of-things(IoT)devices,owing to its unique capability to sustain computation p...IEEE J.Solid-State Circuits,2019,doi:10.1109/JSSC.2018.2884349Nonvolatile processor(NVP)is promising for energy-harvesting-powered internet-of-things(IoT)devices,owing to its unique capability to sustain computation progress over power outages.Recently.展开更多
As the technology of IP-core-reused has been widely used, a lot of intellectual property (IP) cores have been embedded in different layers of system-on-chip (SOC). Although the cycles of development and overhead a...As the technology of IP-core-reused has been widely used, a lot of intellectual property (IP) cores have been embedded in different layers of system-on-chip (SOC). Although the cycles of development and overhead are reduced by this method, it is a challenge to the SOC test. This paper proposes a scheduling method based on the virtual flattened architecture for hierarchical SOC, which breaks the hierarchical architecture to the virtual flattened one. Moreover, this method has more advantages compared with the traditional one, which tests the parent cores and child cores separately. Finally, the method is verified by the ITC'02 benchmark, and gives good results that reduce the test time and overhead effectively.展开更多
Ultrasonic testing systems have been extensively used in medical imaging and non-destructive testing applications. Generally, these systems aim at a particular application or target material. To make these systems por...Ultrasonic testing systems have been extensively used in medical imaging and non-destructive testing applications. Generally, these systems aim at a particular application or target material. To make these systems portable and more adaptable to the test environments, this study presents a reconfigurable ultrasonic testing system (RUTS), which possesses dynamic reconfiguration capabilities. RUTS consists a fully programmable Analog Front-End (AFE), which facilitates beamforming and signal conditioning for variety of applications. RUTS AFE supports up to 8 transducers for phased-array implementation. Xilinx Zynq System-on-Chip (SoC) based Zedboard provides the back-end processing of RUTS. The powerful ARM embedded processor available within Zynq SoC manages the ultrasonic data acquisition/processing and overall system control, which makes RUTS a unique platform for the ultrasonic researchers to experiment and evaluate a wide range of real-time ultrasonic signal processing applications. This Linux-based system is utilized for ultra-sonic data compression implementation providing a versatile environment for further development of ultrasonic imaging and testing system. Furthermore, this study demonstrates the capabilities of RUTS by performing ultrasonic data acquisition and data compression in real-time. Thus, this reconfigurable system enables ultrasonic designers and researchers to efficiently prototype different experiments and to incorporate and analyze high performance ultrasonic signal and image processing algorithms.展开更多
With the prevalence of big-data technology,intricate,nanoscale Multi-Processor System-on-Chips(MP-SoCs)have been used in various safety-critical applications.However,with no extra countermeasures taken,this widespread...With the prevalence of big-data technology,intricate,nanoscale Multi-Processor System-on-Chips(MP-SoCs)have been used in various safety-critical applications.However,with no extra countermeasures taken,this widespread use of MP-SoCs can lead to an undesirable decrease in their dependability.This study presents a promising approach using a group of Embedded Instruments(EIs)inside a processor core for health monitoring.Multiple health monitoring datasets obtained from the employed EIs are sampled and collated via the implemented experiment and thereafter used for conducting its remaining useful lifetime prognostics.This enables MP-SoCs to undertake preventive self-repair,thus realizing a zero mean downtime system and ensuring improved dependability.In addition,a principal component analysis based algorithm is designed for realizing the EI data fusion.Subsequently,a genetic algorithm based degradation optimization is employed to create a lifetime prediction model with respect to the processor.展开更多
First-Input-First-Output (FIFO) buffers are extensively used in contemporary digital processors and System-on-Chips (SoC). There are synchronous FIFOs and asycnrhonous FIFOs. And different sized FIFOs should be implem...First-Input-First-Output (FIFO) buffers are extensively used in contemporary digital processors and System-on-Chips (SoC). There are synchronous FIFOs and asycnrhonous FIFOs. And different sized FIFOs should be implemented in different ways. FIFOs are used not only for the pipeline design within a processor, for the inter-processor communication networks, for example Network-on-Chips (NoCs), but also for the peripherals and the clock domain crossing at the whole SoC level. In this paper, we review the interface, the circuit implementation, and the various usages of FIFOs in various levels of the digital design. We can find that the usage of FIFOs could greatly facilitate the signal storage, signal decoupling, signal transfer, power domain separation and power domain crossing in digital systems. We hope that more attentions are paid to the usages of synchronous and asynchronous FIFOs and more sophististicated usages are discovered by the digital design communities.展开更多
首先根据生化微传感SOC的应用场合和微传感器的特点,选定CR SAR ADC作为片内嵌入类型;基于SOC的标准CMOS工艺实现和低功耗的设计目标,分别进行了电容阵列、比较器、开关阵列和SAR控制逻辑等组成单元全定制原理图、版图设计,实现了片内嵌...首先根据生化微传感SOC的应用场合和微传感器的特点,选定CR SAR ADC作为片内嵌入类型;基于SOC的标准CMOS工艺实现和低功耗的设计目标,分别进行了电容阵列、比较器、开关阵列和SAR控制逻辑等组成单元全定制原理图、版图设计,实现了片内嵌入10位ADC的整体芯片.流片实测结果DNL、INL最大值分别为+/-1.0LSB、+/-1.5LSB,功耗仅为4.62mW,满足生化微传感SOC数据转换的片内嵌入要求.展开更多
With the development of Ethernet systems and the growing capacity of modem silicon technology, embedded communication networks are playing an increasingly important role in embedded and safety critical systems. Hardwa...With the development of Ethernet systems and the growing capacity of modem silicon technology, embedded communication networks are playing an increasingly important role in embedded and safety critical systems. Hardware/software co-design is a methodology for solving design problems in processor based embedded systems. In this work, we implemented a new 1-cycle pipeline microprocessor and a fast Ethemet transceiver and established a low cost, high performance embedded network controller, and designed a TCP/IP stack to access the Intemet. We discussed the hardware/software architecture in the forepart, and then the whole system-on-a-chip on Altera Stratix EP1S25F780C6 device. Using the FPGA environment and SmartBit tester, we tested the system's throughput. Our simulation results showed that the maximum throughput of Ethemet packets is up to 7 Mbps, that of UDP packets is up to 5.8 Mbps, and that of TCP packets is up to 3.4 Mbps, which showed that this embedded system can easily transmit basic voice and video signals through Ethemet, and that using only one chip can realize that many electronic devices access to the Intemet directly and get high performance.展开更多
This paper describes an in-house developed language tool called VPerl used in developing a 250 MHz 32-bit high-performance low power embedded CPU core. The authors showed that use of this tool can compress the Verilog...This paper describes an in-house developed language tool called VPerl used in developing a 250 MHz 32-bit high-performance low power embedded CPU core. The authors showed that use of this tool can compress the Verilog code by more than a factor of 5, increase the efficiency of the front-end design, reduce the bug rate significantly. This tool can be used to enhance the reusability of an intellectual property model, and facilitate porting design for different platforms.展开更多
Field Programmable Gate Array(FPGA) is an efficient reconfigurable integrated circuit platform and has become a core signal processing microchip device of digital systems over the last decade. With the rapid developme...Field Programmable Gate Array(FPGA) is an efficient reconfigurable integrated circuit platform and has become a core signal processing microchip device of digital systems over the last decade. With the rapid development of semiconductor technology, the performance and system integration of FPGA devices have been significantly progressed, and at the same time new challenges arise. The design of FPGA architecture is required to evolve to meet these challenges, while also taking advantage of ever increased microchip density. This survey reviews the recent development of advanced FPGA architectures, including improvement of the programming technologies, logic blocks, interconnects, and embedded resources. Moreover, some important emerging design issues of FPGA architectures, such as novel memory based FPGAs and 3D FPGAs, are also presented to provide an outlook for future FPGA development.展开更多
基金Supported by the National Natural Science Foundation of China(61076019,61106018)the Aeronautical Science Foundation of China(20115552031)+3 种基金the China Postdoctoral Science Foundation(20100481134)the Jiangsu Province Key Technology R&D Program(BE2010003)the Nanjing University of Aeronautics and Astronautics Research Funding(NS2010115)the Nanjing University of Aeronatics and Astronautics Initial Funding for Talented Faculty(1004-YAH10027)~~
文摘Test data compression and test resource partitioning (TRP) are essential to reduce the amount of test data in system-on-chip testing. A novel variable-to-variable-length compression codes is designed as advanced fre- quency-directed run-length (AFDR) codes. Different [rom frequency-directed run-length (FDR) codes, AFDR encodes both 0- and 1-runs and uses the same codes to the equal length runs. It also modifies the codes for 00 and 11 to improve the compression performance. Experimental results for ISCAS 89 benchmark circuits show that AFDR codes achieve higher compression ratio than FDR and other compression codes.
基金supported by the National High Technology Research and Development Program of China (863 Program) (2002AA1Z1490)Specialized Research Fund for the Doctoral Program of Higher Education (20040486049)the University Cooperative Research Fund of Huawei Technology Co., Ltd
文摘In order to deal with the limitations during the register transfer level verification, a new functional verification method based on the random testing for the system-level of system-on-chip is proposed.The validity of this method is proven theoretically.Specifically, testcases are generated according to many approaches of randomization.Moreover, the testbench for the system-level verification according to the proposed method is designed by using advanced modeling language.Therefore, under the circumstances that the testbench generates testcases quickly, the hardware/software co-simulation and co-verification can be implemented and the hardware/software partitioning planning can be evaluated easily.The comparison method is put to use in the evaluation approach of the testing validity.The evaluation result indicates that the efficiency of the partition testing is better than that of the random testing only when one or more subdomains are covered over with the area of errors, although the efficiency of the random testing is generally better than that of the partition testing.The experimental result indicates that this method has a good performance in the functional coverage and the cost of testing and can discover the functional errors as soon as possible.
基金supported by the National Natural Science Foundation of China(Grant Nos.11575138,11835006,11690040,and 11690043)
文摘Single-event effects(SEEs)induced by mediumenergy protons in a 28 nm system-on-chip(SoC)were investigated at the China Institute of Atomic Energy.An on-chip memory block was irradiated with 90 MeV and 70 MeV protons,respectively.Single-bit upset and multicell upset events were observed,and an uppermost number of nine upset cells were discovered in the 90 MeV proton irradiation test.The results indicate that the SEE sensitivities of the 28 nm SoC to the 90 MeV and 70 MeV protons were similar.Cosmic Ray Effects on Micro-Electronics Monte Carlo simulations were analyzed,and it demonstrates that protons can induce effects in a 28 nm SoC if their energies are greater than 1.4 MeV and that the lowest corresponding linear energy transfer was 0.142 MeV cm^2 mg^-1.The similarities and discrepancies of the SEEs induced by the 90 MeV and 70 MeV protons were analyzed.
基金Project supported by the National Natural Science Foundation of China(Grant Nos.11575138,11835006,11690040,and 11690043)the Fund from Innovation Center of Radiation Application(Grant No.KFZC2019050321)+1 种基金the Fund from the Science and Technology on Vacuum Technology and Physics Laboratory,Lanzhou Institute of Physics(Grant No.ZWK1804)the Program of China Scholarships Council(Grant No.201906280343)。
文摘Single event effects (SEEs) in a 28-nm system-on-chip (SoC) were assessed using heavy ion irradiations, and susceptibilities in different processor configurations with data accessing patterns were investigated. The patterns included the sole processor (SP) and asymmetric multiprocessing (AMP) patterns with static and dynamic data accessing. Single event upset (SEU) cross sections in static accessing can be more than twice as high as those of the dynamic accessing, and processor configuration pattern is not a critical factor for the SEU cross sections. Cross section interval of upset events was evaluated and the soft error rates in aerospace environment were predicted for the SoC. The tests also indicated that ultra-high linear energy transfer (LET) particle can cause exception currents in the 28-nm SoC, and some even are lower than the normal case.
文摘IEEE J.Solid-State Circuits,2019,doi:10.1109/JSSC.2018.2884349Nonvolatile processor(NVP)is promising for energy-harvesting-powered internet-of-things(IoT)devices,owing to its unique capability to sustain computation progress over power outages.Recently.
基金Project supported by the Applied Materials Foundation Project of Science and Technology Commission of Shanghai Mu-nicipality (Grant No.08700741000)the System Design on Chip Project of Science and Technology Commission of Shanghai Municipality (Grant No.08706201000)+1 种基金the Leading Academic Discipline Project of Shanghai Municipal Education Committee(Grant No.J50104)the Innovation Foundation Project of Shanghai University
文摘As the technology of IP-core-reused has been widely used, a lot of intellectual property (IP) cores have been embedded in different layers of system-on-chip (SOC). Although the cycles of development and overhead are reduced by this method, it is a challenge to the SOC test. This paper proposes a scheduling method based on the virtual flattened architecture for hierarchical SOC, which breaks the hierarchical architecture to the virtual flattened one. Moreover, this method has more advantages compared with the traditional one, which tests the parent cores and child cores separately. Finally, the method is verified by the ITC'02 benchmark, and gives good results that reduce the test time and overhead effectively.
文摘Ultrasonic testing systems have been extensively used in medical imaging and non-destructive testing applications. Generally, these systems aim at a particular application or target material. To make these systems portable and more adaptable to the test environments, this study presents a reconfigurable ultrasonic testing system (RUTS), which possesses dynamic reconfiguration capabilities. RUTS consists a fully programmable Analog Front-End (AFE), which facilitates beamforming and signal conditioning for variety of applications. RUTS AFE supports up to 8 transducers for phased-array implementation. Xilinx Zynq System-on-Chip (SoC) based Zedboard provides the back-end processing of RUTS. The powerful ARM embedded processor available within Zynq SoC manages the ultrasonic data acquisition/processing and overall system control, which makes RUTS a unique platform for the ultrasonic researchers to experiment and evaluate a wide range of real-time ultrasonic signal processing applications. This Linux-based system is utilized for ultra-sonic data compression implementation providing a versatile environment for further development of ultrasonic imaging and testing system. Furthermore, this study demonstrates the capabilities of RUTS by performing ultrasonic data acquisition and data compression in real-time. Thus, this reconfigurable system enables ultrasonic designers and researchers to efficiently prototype different experiments and to incorporate and analyze high performance ultrasonic signal and image processing algorithms.
基金This study was supported by the National Natural Science Foundation of China(Nos.12271259,12271098,and 11971349)EU project BASTION(No.619871)+2 种基金Horizon 2020 IMMORTAL(No.644905)Recore Systems B.V.(the Netherlands)Ridgetop Group Inc.(the Netherlands)are acknowledged for their contributions to IC design and measurement。
文摘With the prevalence of big-data technology,intricate,nanoscale Multi-Processor System-on-Chips(MP-SoCs)have been used in various safety-critical applications.However,with no extra countermeasures taken,this widespread use of MP-SoCs can lead to an undesirable decrease in their dependability.This study presents a promising approach using a group of Embedded Instruments(EIs)inside a processor core for health monitoring.Multiple health monitoring datasets obtained from the employed EIs are sampled and collated via the implemented experiment and thereafter used for conducting its remaining useful lifetime prognostics.This enables MP-SoCs to undertake preventive self-repair,thus realizing a zero mean downtime system and ensuring improved dependability.In addition,a principal component analysis based algorithm is designed for realizing the EI data fusion.Subsequently,a genetic algorithm based degradation optimization is employed to create a lifetime prediction model with respect to the processor.
文摘First-Input-First-Output (FIFO) buffers are extensively used in contemporary digital processors and System-on-Chips (SoC). There are synchronous FIFOs and asycnrhonous FIFOs. And different sized FIFOs should be implemented in different ways. FIFOs are used not only for the pipeline design within a processor, for the inter-processor communication networks, for example Network-on-Chips (NoCs), but also for the peripherals and the clock domain crossing at the whole SoC level. In this paper, we review the interface, the circuit implementation, and the various usages of FIFOs in various levels of the digital design. We can find that the usage of FIFOs could greatly facilitate the signal storage, signal decoupling, signal transfer, power domain separation and power domain crossing in digital systems. We hope that more attentions are paid to the usages of synchronous and asynchronous FIFOs and more sophististicated usages are discovered by the digital design communities.
文摘首先根据生化微传感SOC的应用场合和微传感器的特点,选定CR SAR ADC作为片内嵌入类型;基于SOC的标准CMOS工艺实现和低功耗的设计目标,分别进行了电容阵列、比较器、开关阵列和SAR控制逻辑等组成单元全定制原理图、版图设计,实现了片内嵌入10位ADC的整体芯片.流片实测结果DNL、INL最大值分别为+/-1.0LSB、+/-1.5LSB,功耗仅为4.62mW,满足生化微传感SOC数据转换的片内嵌入要求.
文摘With the development of Ethernet systems and the growing capacity of modem silicon technology, embedded communication networks are playing an increasingly important role in embedded and safety critical systems. Hardware/software co-design is a methodology for solving design problems in processor based embedded systems. In this work, we implemented a new 1-cycle pipeline microprocessor and a fast Ethemet transceiver and established a low cost, high performance embedded network controller, and designed a TCP/IP stack to access the Intemet. We discussed the hardware/software architecture in the forepart, and then the whole system-on-a-chip on Altera Stratix EP1S25F780C6 device. Using the FPGA environment and SmartBit tester, we tested the system's throughput. Our simulation results showed that the maximum throughput of Ethemet packets is up to 7 Mbps, that of UDP packets is up to 5.8 Mbps, and that of TCP packets is up to 3.4 Mbps, which showed that this embedded system can easily transmit basic voice and video signals through Ethemet, and that using only one chip can realize that many electronic devices access to the Intemet directly and get high performance.
文摘This paper describes an in-house developed language tool called VPerl used in developing a 250 MHz 32-bit high-performance low power embedded CPU core. The authors showed that use of this tool can compress the Verilog code by more than a factor of 5, increase the efficiency of the front-end design, reduce the bug rate significantly. This tool can be used to enhance the reusability of an intellectual property model, and facilitate porting design for different platforms.
基金Supported by National Natural Science Foundation of China(No.61271149)National High Technology Research and Development Program of China(No.2012AA-012301)National Science and Technology Major Project of China(No.2013ZX03006004)
文摘Field Programmable Gate Array(FPGA) is an efficient reconfigurable integrated circuit platform and has become a core signal processing microchip device of digital systems over the last decade. With the rapid development of semiconductor technology, the performance and system integration of FPGA devices have been significantly progressed, and at the same time new challenges arise. The design of FPGA architecture is required to evolve to meet these challenges, while also taking advantage of ever increased microchip density. This survey reviews the recent development of advanced FPGA architectures, including improvement of the programming technologies, logic blocks, interconnects, and embedded resources. Moreover, some important emerging design issues of FPGA architectures, such as novel memory based FPGAs and 3D FPGAs, are also presented to provide an outlook for future FPGA development.