Integration of a field-effect-transistor terahertz detector with a diagonal horn antenna

Efficient coupling of terahertz electromagnetic wave with the active region in a terahertz detector is required to enhance the optical sensitivity. In this work, we demonstrate direct integration of a field-effect-transistor（FET） terahertz detector chip at the waveguide port of a horn antenna. Although the integration without a proper backshot is rather preliminary, the noise-equivalent power is greatly reduced from 2.7 nW/Hz^（1/2） for the bare detector chip to 76 pW/Hz^（1/2） at340 GHz. The enhancement factor of about 30 is confirmed by simulations revealing the effective increase in the energy flux density seen by the detector. The simulation further confirms the frequency response of the horn antenna and the onchip antennas. A design with the detector chip fully embedded within a waveguide cavity could be made to further enhance the coupling efficiency.

Performance enhancement of CMOS terahertz detector by drain current

In this paper, we study the effect of the drain current on terahertz detection for Si metal-oxide semiconductor fieldeffect transistors（MOSFETs） both theoretically and experimentally. The analytical model, which is based on the smallsignal equivalent circuit of MOSFETs, predicts the significant improvement of the voltage responsivity Rv with the bias current. The experiment on antennas integrated with MOSFETs agrees with the analytical model, but the Rv improvement is accompanied first by a decrease, then an increase of the low-noise equivalent power（NEP） with the applied current. We determine the tradeoff between the low-NEP and high-Rv for the current-biased detectors. As the best-case scenario, we obtained an improvement of about six times in Rv without the cost of a higher NEP. We conclude that the current supply scheme can provide high-quality signal amplification in practical CMOS terahertz detection.

The origin of distorted intensity pattern sensed by a lens and antenna coupled AlGaN/GaN-HEMT terahertz detector

Antenna-coupled field-effect-transistors(FETs) offer high sensitivity for terahertz detection. Both the magnitude and the polarity of the response signal are sensitive to the localized terahertz field under the gate. The ability of accurate sensing the intensity pattern is required for terahertz imaging systems. Here, we report artefacts in the intensity pattern of a focused terahertz beam around 1 THz by scanning a silicon-lens and antenna coupled AlGaN/GaN high-electron-mobility-transistor(HEMT) detector. The origin of the image distortion is found to be connected with one of the antenna blocks by probing the localized photocurrents as a function of the beam location and the frequency. Although the exact distortion is found with our specific antenna design, we believe similar artefacts could be commonplace in antenna-coupled FET terahertz detectors when the beam spot becomes comparable with the antenna size. To eliminate such artefacts, new antenna designs are welcomed to achieve strong asymmetry in the terahertz field distribution under the gate while maintaining a more symmetric radiation pattern for the whole antenna.

Enhancement of terahertz coupling efficiency by improved antenna design in GaN/AlGaN high electron mobility transistor detectors

An optimized micro-gated terahertz detector with novel triple resonant antenna is presented.The novel resonant antenna operates at room temperature and shows more than a 700% increase in photocurrent response compared to the conventional bowtie antenna.In finite-difference-time-domain simulations,we found the performance of the self-mixing GaN/AlGaN high electron mobility transistor detector is mainly dependent on the parameters L gs（the gap between the gate and the source/drain antenna） and L w（the gap between the source and drain antenna）.With the improved triple resonant antenna,an optimized micrometer-sized AlGaN/GaN high electron mobility transistor detector can achieve a high responsivity of 9.45×102 V/W at a frequency of 903 GHz at room temperature.

Characterization of a room temperature terahertz detector based on a GaN/AlGaN HEMT

We report on the characterization of a room temperature terahertz detector based on a GaN/AlGaN high electron mobility transistor integrated with three patch antennas.Experimental results prove that both horizontal and perpendicular electric fields are induced in the electron channel.A photocurrent is generated when the electron channel is strongly modulated by the gate voltage.Despite the large channel length and gate-source/drain distance, significant horizontal and perpendicular fields are achieved.The device is well described by the self-mixing of terahertz fields in the electron channel.The noise-equivalent power and responsivity are estimated to be 100 nW/（Hz）^（1/2） and 3 mA/ W at 292 K,respectively.No decrease in responsivity is observed up to a modulation frequency of 5 kHz. The detector performance can be further improved by engineering the source-gate-drain geometry to enhance the nonlinearity.

A High Performance Terahertz Waveguide Detector Based on a Low-Barrier Diode

A Schottky barrier diode with low-barrier is presented, based on which a terahertz waveguide detector working at 500-600 GHz is designed and fabricated. By using the InGaAs/InP material system, the feature of the low barrier is obtained which greatly improves the performance of the detector. The measured typical voltage responsivity is about 900 V/W at 50-560 OHz and is about 400 V/W at 560 600 GHz. The proposed broadband waveguide detector has the characteristics of simple structure, compact size, low cost and high performance, and can be used in a variety of applications such as imaging, moleeuIar spectroscopy and atmospheric remote sensing.

Terahertz Direct Detectors Based on Superconducting Hot Electron Bolometers with Microwave Biasing

Terahertz （THz） direct detectors based on superconducting niobium nitride （NbN） hot electron bolometers （HEBs） with microwave （MW） biasing are studied. The MW is used to bias the HEB to the optimum point and to readout the impedance changes caused by the incident THz signals. Compared with the thermal biasing method, this method would be more promising in large scale array with simple readout. The used NbN HEB has an excellent performance as heterodyne detector with the double sideband noise temperature （T N） of 403K working at 4.2K and 0.65THz. As a result, the noise equivalent power of 1.5pW/Hz 1/2 and the response time of 64ps are obtained for the direct detectors based on the NbN HEBs and working at 4.2K and 0.65THz.

Mapping an on-chip terahertz antenna by a scanning near-field probe and a fixed field-effect transistor

In the terahertz（THz） regime,the active region for a solid-state detector usually needs to be implemented accurately in the near-field region of an on-chip antenna.Mapping of the near-field strength could allow for rapid verification and optimization of new antenna/detector designs.Here,we report a proof-of-concept experiment in which the field mapping is realized by a scanning metallic probe and a fixed AlGaN/GaN field-effect transistor.Experiment results agree well with the electromagnetic-wave simulations.The results also suggest a field-effect THz detector combined with a probe tip could serve as a high sensitivity THz near-field sensor.

Progress of Terahertz Devices Based on Graphene

Graphene is a one-atom-thick planar sheet of sp2-hybridized orbital bonded honeycomb carbon crystal. Its gapless and linear energy spectra of electrons and holes lead to the unique carrier transport and optical properties, such as giant carrier mobility and broadband flat optical response. As a novel material, graphene has been regarded to be extremely suitable and competent for the development of terahertz （THz） optical devices. In this paper, the fundamental electronic and optic properties of graphene are described. Based on the energy band structure and light transmittance properties of graphene, many novel graphene based THz devices have been proposed, including modulator, generator, detector, and imaging device. This progress has been reviewed. Future research directions of the graphene devices for THz applications are also proposed.

运用GQFD的手持反射式太赫兹光谱探测器性能指标分析

在对手持反射式太赫兹光谱探测器性能指标分析过程中,通过爆炸物探测任务需求分析,采用界值法筛选了光谱分辨率、动态范围等8项性能指标,剔除了光谱获取率和快速扫描时间2项指标,运用灰关联分析的质量展开功能方法,建立任务需求与性能指标的质量屋模型。通过计算绝对权值与灰色综合关联矩阵,求解性能指标重要度排序,验证了方法的可行性和有效性。该方法减少了主观因素对权重计算的影响,提高了需求分析结果的可靠性,可为手持反射式太赫兹光谱探测器技术研发和决策提供有效支撑。

一种基于太赫兹成像的复杂地形自适应定高方法

针对现有近感探测器难以适应复杂地形情况下的精确定高问题,提出一种基于成像的图像域自适应对地高度估计方法。该方法将多普勒锐化成像原理应用到前下视场景,利用太赫兹频段分辨力高、孔径合成长度短的优势,采用太赫兹前下视成像实现地形感知,将传统近感探测器的一维距离测量扩展为二维成像测量,实现对运动轨迹前下方地形地貌的精确感知。在获得地面目标图像后,利用地面图像特征,采用图像域特征拟合方法实现对地高度估计。对前下视多普勒锐化成像的参数设计和成像算法进行了理论分析和仿真验证,开发了一套工作于220 GHz频段的太赫兹近感探测系统,并开展了无人机挂载试验。试验表明,该方法能有效感知地表目标环境,排除角反、树木等其他目标对地面高度测量的干扰,测高精确度达0.5 m,证明了该基于太赫兹成像的对地高度估计方法的可行性,为基于图像域特征提升近感探测器对复杂地形适应能力和感知能力奠定了工作基础。

侧栅晶体管太赫兹探测器的物理模型、结构制备与直流测试

针对侧栅结构高电子迁移率晶体管(High Electron Mobility Transistors,HEMTs)太赫兹探测器,构建了器件的直流输运和太赫兹探测的物理模型。运用自对准工艺,成功制备了形态良好、接触可靠的侧栅结构,有效地解决了器件双侧栅与台面间的接触问题,最终获得了不同栅宽(200 nm、800 nm和1400 nm)的侧栅GaN/AlGaN HEMT太赫兹探测器。通过直流测试表征发现,不同器件的栅宽与其阈值电压之间呈现出明显的线性关系,验证了侧栅结构HEMT太赫兹探测器的直流输运模型。上述结果为完整的侧栅HEMT太赫兹探测器的理论模型提供了实验验证和指导,为侧栅HEMT太赫兹探测器的发展提供了重要支持。

石墨烯-MnBi_(2)Te_(4)异质结室温高灵敏度太赫兹探测器

太赫兹技术因其在医学成像、深空探索、无线通信、无损检测等领域的应用前景而受到广泛关注。然而,常温条件下对太赫兹辐射进行高灵敏度检测仍然是一个极大的技术挑战。文中利用低热导率的磁性拓扑绝缘体MnBi_(2)Te_(4)与高热导率的石墨烯形成范德华异质结,进而构建了一种异质结结构的太赫兹探测器。室温条件下,在0.04 THz与0.12 THz的频率太赫兹辐射照射下,探测器展现出超快的光电响应速度(16μs)和较高的响应度(0.43 mA/W和4.61 mA/W),同时具备较低的噪声等效功率(2.04 nW/Hz^(1/2)和190.58 pW/Hz^(1/2))。结果表明,基于石墨烯-MnBi_(2)Te_(4)异质结的太赫兹探测器在太赫兹探测领域具有巨大的应用潜力。

RTD太赫兹探测器与片上天线的匹配技术

高信息传输速率和大带宽容量的太赫兹通信被认为是实现6G的关键技术,这需要高效、稳定和紧凑的太赫兹源和探测器。为提升探测性能,研究了一种共振隧穿二极管(RTD)与缝隙天线片上集成的准光式太赫兹探测器。针对电路的高频损耗和寄生效应问题,采用协同考虑阻抗匹配因子和天线辐射效率的设计准则,设计了0.67 THz的小偏压RTD偏馈式探测器。采用高频结构仿真器(HFSS)和先进设计系统(ADS)软件联合仿真表征其探测性能,当输入功率为-30 dBm时,该探测器在0.67 THz的电流灵敏度达2.349 A/W,相比微波段采用阻抗匹配因子最大的设计准则,灵敏度提升了28.01%。

应用于太赫兹探测器的宽带减反结构设计

在太赫兹波段,高阻硅和蓝宝石具有低吸收率、高电阻率和低光谱色散等优良特性,常被用作器件的衬底材料。然而,它们的折射率与空气存在较大差异,导致从空气入射的太赫兹波在界面发生大量反射,从而降低了波的透过率;同时,还可能会引发法布里-珀罗谐振腔效应,进而限制太赫兹探测器的工作带宽和灵敏度。为降低界面反射,文章提出一种太赫兹波段的三层减反射结构,借助Matlab中传输矩阵法和电磁场仿真中有限元法进行仿真,筛选出Mylar/Al_(2)O_(3)/AlN的材料组合。仿真结果表明,在340 GHz的入射波照射下,该结构在275~405 GHz范围内反射率均低于-20 dB,将其应用于太赫兹探测器后,-3 dB带宽提升至50 GHz以上,响应度提高了3.2倍。该结构制备简单、成本低廉,为太赫兹波段的宽带减反提供了一种经济且有效的解决方案。

场效应晶体管太赫兹探测器在太赫兹成像领域的研究进展(下)

太赫兹(Terahertz,THz)波具有能量低、穿透性强、分辨率高等特性,因而THz成像技术在安全检测、医学诊断、无损探伤等领域具有广阔的应用前景。THz探测器作为THz成像系统的重要组成部分,其性能对成像分辨率、成像速度等有重要影响。由于具备可室温工作、易大面积集成、响应速度快等特性,场效应晶体管(Field Effect Transistor,FET)THz探测器在成像应用中潜力巨大。综述了近年来FET THz探测器在THz成像领域的研究进展(包括成像阵列、材料选择等方面),分析了设计和制造中存在的问题;指出天线和像素间距是限制大规模阵列化的重要因素,并在此基础上对未来的研究方向进行了展望;指出新的材料和结构设计将进一步改善器件性能,从而实现更快速、更清晰的THz成像。

场效应晶体管太赫兹探测器在太赫兹成像领域的研究进展(上)

太赫兹(Terahertz,THz)波具有能量低、穿透性强、分辨率高等特性,因而THz成像技术在安全检测、医学诊断、无损探伤等领域具有广阔的应用前景。THz探测器作为THz成像系统的重要组成部分,其性能对成像分辨率、成像速度等有重要影响。由于具备可室温工作、易大面积集成、响应速度快等特性,场效应晶体管(Field Effect Transistor,FET)THz探测器在成像应用中潜力巨大。综述了近年来FET THz探测器在THz成像领域的研究进展(包括成像阵列、材料选择等方面),分析了设计和制造中存在的问题;指出天线和像素间距是限制大规模阵列化的重要因素,并在此基础上对未来的研究方向进行了展望;指出新的材料和结构设计将进一步改善器件性能,从而实现更快速、更清晰的THz成像。

基于共振隧穿二极管的太赫兹技术研究进展

共振隧穿二极管(Resonant Tunneling Diode, RTD)是一种基于量子隧穿效应的半导体器件,同时具有非线性特性和负阻特性,通过改变偏置电压可以作为太赫兹源和太赫兹探测器,在未来6G技术中通信感知一体化方面具有优势。简要总结了基于RTD实现的器件的工作原理,对基于RTD实现的太赫兹源和太赫兹探测器、太赫兹通信系统以及太赫兹雷达系统等太赫兹技术的研究进展进行介绍,并对当前存在的技术挑战和未来的发展方向进行探讨。基于RTD的太赫兹技术凭借其突出的优势,将成为未来电子器件领域重要的发展方向。

基于AlGaN/GaN HEMT外差探测器的太赫兹线阵列矢量探测系统

为了研究AlGaN/GaN高电子迁移率晶体管(High-Electron-Mobility Transistor,HEMT)外差探测器应用于太赫兹来波方向(Direction of Arrival,DOA)估计领域的可行性及量化性能指标,基于AlGaN/GaN HEMT 243GHz外差探测器搭建了太赫兹波线阵列矢量探测系统,实现了太赫兹连续波的相位分布和来波方向的测量。该系统的核心器件为准光-波导耦合的太赫兹外差探测器线阵列组件,阵元平均噪声等效功率(Noise-Equivalent-Power,NEP)为-123.89dBm/Hz。通过测试,表明该系统相位解析稳定度优于0.6°,线阵列组件法线(阵列芯片的垂线)方向左右11°以内的太赫兹来波方向的检测误差小于0.25°。讨论了存在误差的原因及可能的解决方案,为后续基于AlGaN/GaN HEMT面阵列的太赫兹相控阵雷达及定向通信系统的研制提供了基础。

基于超表面的宽带太赫兹热释电探测器设计

为了解决传统太赫兹(THz)探测器吸收效率低,频率范围小的问题,提出将双层超表面吸收阵列结构与钽酸锂热释电探测器相贴合,构成宽带太赫兹超表面热释电探测器。采用MATLAB和CST联合仿真的优化方法对超表面结构进行按需优化;使用ANSYS对热释电探测器进行仿真分析,得到敏感层、绝热层等特征参数对太赫兹热释电探测器的温度变化率以及响应电流的影响。结果表明,采用超表面阵列结构提高了全THz波段的探测性能,凳型热释电探测器在给定条件下的平均热释电电流输出为31.52 pA。使用超表面作为吸收结构可以使热释电探测器具有连续且高效的吸波特性,为宽带太赫兹探测器的设计提供参考。