Conventional electron and optical microscopy techniques require the sample to be sectioned, polished or etched to expose the internal surfaces for imaging. However, such sample preparation techniques have traditionall...Conventional electron and optical microscopy techniques require the sample to be sectioned, polished or etched to expose the internal surfaces for imaging. However, such sample preparation techniques have traditionally prevented the observation of the same sample over time, under realistic three-dimensional geometries and in an environment representative of real-world operating conditions. X-ray microscopy (XRM) is a rapidly emerging technique that enables non-destructive evaluation of buried structures within hard to soft materials in 3D, requiring little to no sample preparation. Furthermore in situ and 4D quantification of microstructural evolution under controlled environment as a function of time, temperature, chemistry or stress can be done repeatable on the same sample, using practical specimen sizes ranging from tens of microns to several cm diameter, with achievable imaging resolution from submicron to 50 nm. Many of these studies were reported using XRM in synchrotron beamlines. These include crack propagation on composite and construction materials; corrosion studies; microstructural changes during the setting of cement; flow studies within porous media to mention but a few.展开更多
文摘Conventional electron and optical microscopy techniques require the sample to be sectioned, polished or etched to expose the internal surfaces for imaging. However, such sample preparation techniques have traditionally prevented the observation of the same sample over time, under realistic three-dimensional geometries and in an environment representative of real-world operating conditions. X-ray microscopy (XRM) is a rapidly emerging technique that enables non-destructive evaluation of buried structures within hard to soft materials in 3D, requiring little to no sample preparation. Furthermore in situ and 4D quantification of microstructural evolution under controlled environment as a function of time, temperature, chemistry or stress can be done repeatable on the same sample, using practical specimen sizes ranging from tens of microns to several cm diameter, with achievable imaging resolution from submicron to 50 nm. Many of these studies were reported using XRM in synchrotron beamlines. These include crack propagation on composite and construction materials; corrosion studies; microstructural changes during the setting of cement; flow studies within porous media to mention but a few.
