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Optimization Model for Environmental Stress Screening of Electronic Components 被引量:1
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作者 Li Fang Institute of Systems engineering, HUST, wuhan 430074, p. r. china Zhu Cheng & wang wei dept. of management engineering, naval university of engineering, wuhan 430033, p. r. china 《Journal of Systems Engineering and Electronics》 SCIE EI CSCD 2001年第1期29-33,共5页
Environmental stress screening (ESS) is a technological process to reduce the costly early field failure of electronic components. This paper builds an optimization model for ESS of electronic components to obtain the... Environmental stress screening (ESS) is a technological process to reduce the costly early field failure of electronic components. This paper builds an optimization model for ESS of electronic components to obtain the optimal ESS duration. The failure phenomena of ESS are modeled by mixed distribution, and optimal ESS duration is defined by maximizing life-cycle cost savings under the condition of meeting reliability requirement. 展开更多
关键词 Electric fields Environmental testing Failure analysis Life cycle Mathematical models OPTIMIZATION RELIABILITY
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