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Measurement of Density Profile with Step-Swept Microwave Reflectometry
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作者 潘宇东 伊藤智之 《Plasma Science and Technology》 SCIE EI CAS CSCD 2003年第2期1689-1694,共6页
A one-channel microwave reflectometer is used to measure the electron densityprofile in a low-density plasma experiment (n_e < 0.27 x 10^(19) m^(-3)) sustained by 2.45 GHzlower hybrid current drive (LHCD) on TRIAM-... A one-channel microwave reflectometer is used to measure the electron densityprofile in a low-density plasma experiment (n_e < 0.27 x 10^(19) m^(-3)) sustained by 2.45 GHzlower hybrid current drive (LHCD) on TRIAM-1M. In order to remove the effect of phase runawayphenomena, a step-like frequency-sweeping way is used and a special phase analysis technique isintroduced. The density profile is reconstructed in TRIAM-1M with the swept frequency ranged from 6GHz to 15 GHz. The corresponding cutoff density is from (0.045 ~ 0.28) x 10^(19) m^(-3) in theordinary polarization mode. The results are in good agreement with the measurements from amulti-channel 2 mm-wavelength interferometer. 展开更多
关键词 REFLECTOMETRY phase runaway phenomena electron density profile
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