一、企业IPO的步骤
IPO,全称Initial public offerings （首次公开募股）,是指股份有限公司首次向社会公众公开发行股票募集资金,它是企业权益融资的重要途径.IPO是现代企业获得长期稳定资本性资金、提升企业品牌价值及市场影响力、...一、企业IPO的步骤
IPO,全称Initial public offerings （首次公开募股）,是指股份有限公司首次向社会公众公开发行股票募集资金,它是企业权益融资的重要途径.IPO是现代企业获得长期稳定资本性资金、提升企业品牌价值及市场影响力、提升企业价值和实现企业的规范发展的重要途径.企业要完成IPO,一般需要经过改制阶段、辅导阶段、审核阶段和发行阶段等四个阶段：展开更多
We report a novel structure of A1GaN/GaN heterostructure field effect transistors （HFETs） with a Si and Mg pair- doped interlayer grown on Si substrate. By optimizing the doping concentrations of the pair-doped inte...We report a novel structure of A1GaN/GaN heterostructure field effect transistors （HFETs） with a Si and Mg pair- doped interlayer grown on Si substrate. By optimizing the doping concentrations of the pair-doped interlayers, the mobility of 2DEG increases by twice for the conventional structure under 5 K due to the improved crystalline quality of the conduction channel. The proposed HFET shows a four orders lower off-state leakage current, resulting in a much higher on/off ratio （ - 10^9）. Further temperature-dependent performance of Schottky diodes revealed that the inhibition of shallow surface traps in proposed HFETs should be the main reason for the suppression of leakage current.展开更多
The influences of dry-etching damage on the electrical properties of an AlGaN/GaN Schottky barrier diode with ICPrecessed anode was investigated for the first time. It was found that the turn-on voltage is decreased w...The influences of dry-etching damage on the electrical properties of an AlGaN/GaN Schottky barrier diode with ICPrecessed anode was investigated for the first time. It was found that the turn-on voltage is decreased with the increase of dry-etching power. Furthermore, the leakage currents in the reverse bias region above pinch-off voltage rise as radio frequency（RF） power increases, while below pinch-off voltage, leakage currents tend to be independent of RF power.Based on detailed current–voltage–temperature（I–V –T） measurements, the barrier height of thermionic-field emission（TFE） from GaN is lowered as RF power increases, which results in early conduction. The increase of leakage current can be explained by Frenkel–Poole（FP） emission that higher dry-etching damage in the sidewall leads to the higher tunneling current, while below pinch-off voltage, the leakage is only related to the AlGaN surface, which is independent of RF power.展开更多
文摘一、企业IPO的步骤
IPO,全称Initial public offerings （首次公开募股）,是指股份有限公司首次向社会公众公开发行股票募集资金,它是企业权益融资的重要途径.IPO是现代企业获得长期稳定资本性资金、提升企业品牌价值及市场影响力、提升企业价值和实现企业的规范发展的重要途径.企业要完成IPO,一般需要经过改制阶段、辅导阶段、审核阶段和发行阶段等四个阶段：
基金supported by the National Natural Science Foundation of China(Grant Nos.51177175 and 61274039)the National Basic Research Project of China(Grant Nos.2010CB923200 and 2011CB301903)+4 种基金the Ph.D.Program Foundation of Ministry of Education of China(Grant No.20110171110021)the International Sci.&Tech.Collaboration Program of China(Grant No.2012DFG52260)the National High-tech R&D Program of China(Grant No.2014AA032606)the Science and Technology Plan of Guangdong Province,China(Grant No.2013B010401013)the Opened Fund of the State Key Laboratory on Integrated Optoelectronics(Grant No.IOSKL2014KF17)
文摘We report a novel structure of A1GaN/GaN heterostructure field effect transistors （HFETs） with a Si and Mg pair- doped interlayer grown on Si substrate. By optimizing the doping concentrations of the pair-doped interlayers, the mobility of 2DEG increases by twice for the conventional structure under 5 K due to the improved crystalline quality of the conduction channel. The proposed HFET shows a four orders lower off-state leakage current, resulting in a much higher on/off ratio （ - 10^9）. Further temperature-dependent performance of Schottky diodes revealed that the inhibition of shallow surface traps in proposed HFETs should be the main reason for the suppression of leakage current.
基金Project supported by the National Natural Science Foundation of China(Grant Nos.51177175 and 61274039)the National Basic Research Program of China(Grant Nos.2010CB923200 and 2011CB301903)+4 种基金the Ph.D. Programs Foundation of Ministry of Education of China(Grant No.20110171110021)the International Science and Technology Collaboration Program of China(Grant No.2012DFG52260)the National High Technology Research and Development Program of China(Grant No.2014AA032606)the Science and Technology Plan of Guangdong Province,China(Grant No.2013B010401013)the Opened Fund of the State Key Laboratory on Integrated Optoelectronics,China(Grant No.IOSKL2014KF17)
文摘The influences of dry-etching damage on the electrical properties of an AlGaN/GaN Schottky barrier diode with ICPrecessed anode was investigated for the first time. It was found that the turn-on voltage is decreased with the increase of dry-etching power. Furthermore, the leakage currents in the reverse bias region above pinch-off voltage rise as radio frequency（RF） power increases, while below pinch-off voltage, leakage currents tend to be independent of RF power.Based on detailed current–voltage–temperature（I–V –T） measurements, the barrier height of thermionic-field emission（TFE） from GaN is lowered as RF power increases, which results in early conduction. The increase of leakage current can be explained by Frenkel–Poole（FP） emission that higher dry-etching damage in the sidewall leads to the higher tunneling current, while below pinch-off voltage, the leakage is only related to the AlGaN surface, which is independent of RF power.
