Single crystal of Lu2Si2OT：Pr was grown by Czochralski method. Transmittance, photoluminescence excitation （PLE） and photo- luminescence （PL） spectra, X-ray excited luminescence （XEL） and fluorescence decay tim...Single crystal of Lu2Si2OT：Pr was grown by Czochralski method. Transmittance, photoluminescence excitation （PLE） and photo- luminescence （PL） spectra, X-ray excited luminescence （XEL） and fluorescence decay time spectra of the sample were measured and dis- cussed to investigate its optical characteristics. The crystal structure of the as grown Lu2Si207：Pr was confirmed to be C2/m. There was a broad absorption peaking at 245 um in the region from 200-260 urn. The PL spectntm was dominated by fast 3py^3Hj band peaking at 524 nm. The XEL spectrum was dominated by the fast 5d14t^---~41e emission peaking at 265 nm. The 2D （temperature-intensity） and 3D （tem- perature-wavelength-intensity） thermally stimulated luminescence （TSL） spectra were measured. The Pr3＋ ion was found to be the recombina- tion center during the TSL process. Three obvious traps were detected in LPS：Pr single crystal with energy depth at 1.06, 0.78 and 0.67 eV.展开更多
基金Project supported by National Natural Science Foundation of China(50902145,51171239)the Natural Science Foundation of Shanghai(09ZR1435800)the Knowledge Innovation Program of the Chinese Academy of Sciences(SCX200701)
文摘Single crystal of Lu2Si2OT：Pr was grown by Czochralski method. Transmittance, photoluminescence excitation （PLE） and photo- luminescence （PL） spectra, X-ray excited luminescence （XEL） and fluorescence decay time spectra of the sample were measured and dis- cussed to investigate its optical characteristics. The crystal structure of the as grown Lu2Si207：Pr was confirmed to be C2/m. There was a broad absorption peaking at 245 um in the region from 200-260 urn. The PL spectntm was dominated by fast 3py^3Hj band peaking at 524 nm. The XEL spectrum was dominated by the fast 5d14t^---~41e emission peaking at 265 nm. The 2D （temperature-intensity） and 3D （tem- perature-wavelength-intensity） thermally stimulated luminescence （TSL） spectra were measured. The Pr3＋ ion was found to be the recombina- tion center during the TSL process. Three obvious traps were detected in LPS：Pr single crystal with energy depth at 1.06, 0.78 and 0.67 eV.
