进一步提升高铁的信道切换性能具有重要的现实意义.基于信号功率和车载数据库协同触发机制提出了应用于高速铁路下一代通信专网LTE-R(long term evolution for railway)的新型切换算法,将数据库基站信息和信号功率实测信息的比对结果作...进一步提升高铁的信道切换性能具有重要的现实意义.基于信号功率和车载数据库协同触发机制提出了应用于高速铁路下一代通信专网LTE-R(long term evolution for railway)的新型切换算法,将数据库基站信息和信号功率实测信息的比对结果作为切换触发的判据,能实现中断快速重连和切换锁定等功能.仿真结果表明,该新型切换算法能有效提升LTE-R的信道切换性能,在重叠区关键位置点的触发效率比传统算法提升43.7%,切换成功率达到了99.5%.该协同触发切换算法在LTE-R高铁通信专网上具有广阔的应用前景.展开更多
针对异步对称双栅结构的氧化铟镓锌(InGaZnO)薄膜晶体管(thin film transistors,TFTs),求解泊松方程,并根据载流子在亚阈区、导通区的不同分布特点,在亚阈区引入等效平带电压的概念,在导通区运用Lambert W函数近似,建立异步对称双栅InGa...针对异步对称双栅结构的氧化铟镓锌(InGaZnO)薄膜晶体管(thin film transistors,TFTs),求解泊松方程,并根据载流子在亚阈区、导通区的不同分布特点,在亚阈区引入等效平带电压的概念,在导通区运用Lambert W函数近似,建立异步对称双栅InGaZnO TFT表面电势解析模型。该模型的拟合参数只有2个,能够较好地反映介电层厚度、沟道电压等参数对电势的影响。基于所建模型及TCAD分析,研究InGaZnO层厚度、栅介质层厚度以及缺陷态密度等物理量对独立栅控双栅晶体管表面电势的影响。研究结果表明:在亚阈区,表面电势随着底栅电压增大呈近似线性增大,且在顶栅电压调制作用下平移;在导通区,表面电势随着底栅电压的增加逐步饱和,且电势值与顶栅调制电压作用相关度小。表面电势的解析模型与TCAD数值计算结果对比,具有较高的吻合度;在不同缺陷态密度分布情况下,电势模型的计算值与TCAD分析值相对误差均小于10%。本研究成果有利于了解双栅InGaZnO TFT的导通机制,可用于InGaZnO TFT的器件建模及相关集成电路设计。展开更多
An analytical model for current-voltage behavior of amorphous In-Ga-Zn-O thin-film transistors（a-IGZO TFTs）with dual-gate structures is developed.The unified expressions for synchronous and asynchronous operating mo...An analytical model for current-voltage behavior of amorphous In-Ga-Zn-O thin-film transistors（a-IGZO TFTs）with dual-gate structures is developed.The unified expressions for synchronous and asynchronous operating modes are derived on the basis of channel charges,which are controlled by gate voltage.It is proven that the threshold voltage of asynchronous dual-gate IGZO TFTs is adjusted in proportion to the ratio of top insulating capacitance to the bottom insulating capacitance（C_（TI）/C_（BI））.Incorporating the proposed model with Verilog-A,a touch-sensing circuit using dual-gate structure is investigated by SPICE simulations.Comparison shows that the touch sensitivity is increased by the dual-gate IGZO TFT structure.展开更多
An analytical drain current model on the basis of the surface potential is proposed for indium-gallium zinc oxide(InGaZnO)thin-film transistors(TFTs)with an independent dual-gate(IDG)structure.For a unified expression...An analytical drain current model on the basis of the surface potential is proposed for indium-gallium zinc oxide(InGaZnO)thin-film transistors(TFTs)with an independent dual-gate(IDG)structure.For a unified expression of carriers’distribution for the sub-threshold region and the conduction region,the concept of equivalent flat-band voltage and the Lambert W function are introduced to solve the Poisson equation,and to derive the potential distribution of the active layer.In addition,the regional integration approach is used to develop a compact analytical current-voltage model.Although only two fitting parameters are required,a good agreement is obtained between the calculated results by the proposed model and the simulation results by TCAD.The proposed current-voltage model is then implemented by using Verilog-A for SPICE simulations of a dual-gate InGaZnO TFT integrated inverter circuit.展开更多
文摘进一步提升高铁的信道切换性能具有重要的现实意义.基于信号功率和车载数据库协同触发机制提出了应用于高速铁路下一代通信专网LTE-R(long term evolution for railway)的新型切换算法,将数据库基站信息和信号功率实测信息的比对结果作为切换触发的判据,能实现中断快速重连和切换锁定等功能.仿真结果表明,该新型切换算法能有效提升LTE-R的信道切换性能,在重叠区关键位置点的触发效率比传统算法提升43.7%,切换成功率达到了99.5%.该协同触发切换算法在LTE-R高铁通信专网上具有广阔的应用前景.
基金Supported by the National Key Research and Development Program of China under Grant No 2017YFA0204600the National Natural Science Foundation of China under Grant No 61404002the Science and Technology Project of Hunan Province under Grant No 2015JC3041
文摘An analytical model for current-voltage behavior of amorphous In-Ga-Zn-O thin-film transistors（a-IGZO TFTs）with dual-gate structures is developed.The unified expressions for synchronous and asynchronous operating modes are derived on the basis of channel charges,which are controlled by gate voltage.It is proven that the threshold voltage of asynchronous dual-gate IGZO TFTs is adjusted in proportion to the ratio of top insulating capacitance to the bottom insulating capacitance（C_（TI）/C_（BI））.Incorporating the proposed model with Verilog-A,a touch-sensing circuit using dual-gate structure is investigated by SPICE simulations.Comparison shows that the touch sensitivity is increased by the dual-gate IGZO TFT structure.
基金Project supported by the National Key Research and Development Program of China(Grant No.2017YFA0204600)the Fundamental Research Funds for the Central Universities of Central South University,China(Grant No.2019zzts424)。
文摘An analytical drain current model on the basis of the surface potential is proposed for indium-gallium zinc oxide(InGaZnO)thin-film transistors(TFTs)with an independent dual-gate(IDG)structure.For a unified expression of carriers’distribution for the sub-threshold region and the conduction region,the concept of equivalent flat-band voltage and the Lambert W function are introduced to solve the Poisson equation,and to derive the potential distribution of the active layer.In addition,the regional integration approach is used to develop a compact analytical current-voltage model.Although only two fitting parameters are required,a good agreement is obtained between the calculated results by the proposed model and the simulation results by TCAD.The proposed current-voltage model is then implemented by using Verilog-A for SPICE simulations of a dual-gate InGaZnO TFT integrated inverter circuit.
