Digital structured light （SL） profilometry is increasingly used in three-dimensional （3D） measurement technology. However, the nonlinearity of the off-the-shelf projectors and cameras seriously reduces the measure...Digital structured light （SL） profilometry is increasingly used in three-dimensional （3D） measurement technology. However, the nonlinearity of the off-the-shelf projectors and cameras seriously reduces the measurement accuracy. In this paper, first, we review the nonlinear effects of the projector-camera system in the phase-shifting structured light depth measurement method. We show that high order harmonic wave components lead to phase error in the phase-shifting method. Then a practical method based on frequency domain filtering is proposed for nonlinear error reduction. By using this method, the nonlinear calibration of the SL system is not required. Moreover, both the nonlinear effects of the projector and the camera can be effectively reduced. The simulations and experiments have verified our nonlinear correction method.展开更多
基金Project supported by the Science and Technology Major Projects of Zhejiang Province,China(Grant No.2013C03043-5)
文摘Digital structured light （SL） profilometry is increasingly used in three-dimensional （3D） measurement technology. However, the nonlinearity of the off-the-shelf projectors and cameras seriously reduces the measurement accuracy. In this paper, first, we review the nonlinear effects of the projector-camera system in the phase-shifting structured light depth measurement method. We show that high order harmonic wave components lead to phase error in the phase-shifting method. Then a practical method based on frequency domain filtering is proposed for nonlinear error reduction. By using this method, the nonlinear calibration of the SL system is not required. Moreover, both the nonlinear effects of the projector and the camera can be effectively reduced. The simulations and experiments have verified our nonlinear correction method.
