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COMPOSITIONAL ANALYSIS OF HIGH-TEMPERATURE SUPERCONDUCTOR THIN FILMS BY HIGH ENERGY ELASTIC BACKSCATTERING OF HELIUM IONS
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作者 吴士明 承焕生 +4 位作者 张承霆 要小未 赵国庆 杨福家 华中一 《Nuclear Science and Techniques》 SCIE CAS CSCD 1990年第Z1期89-92,共4页
High energy ion backscattering can be used to enhance the sensitivity of oxygen analysis. At He++ ion energy of 8.8 MeV, the yield due to oxygen is about 25 times larger than that predicted by Rutherford formula. The ... High energy ion backscattering can be used to enhance the sensitivity of oxygen analysis. At He++ ion energy of 8.8 MeV, the yield due to oxygen is about 25 times larger than that predicted by Rutherford formula. The elemental stoichiometry of some bulk and thin film superconductor samples was determined. The details of the measuring method are discribed. 展开更多
关键词 HIGH energy ion BACKSCATTERING HIGH temperature SUPERCONDUCTOR
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