EAST中装置中靶板材料对边缘等离子体的影响

靶板的材料是当前聚变研究中的重要问题之一,偏滤器靶板材料的选择对偏滤器靶板寿命、杂质控制和等离子体参数的提升都有重要意义。在高参数等离子体条件下,会有巨大的粒子流和热流通过刮削层到达偏滤器靶板,进而引起靶板的溅射和侵蚀。因此不同材料的靶板在等离子体轰击下对边缘区域等离子体参数的影响也会不同。在本工作中,我们使用三维边缘输运程序EMC3-EIRENE研究了锂、硼、碳、钨四种不同的靶板材料下的电子密度、电子温度以及中性粒子密度的分布。结果发现钨靶板的下游电子密度明显低于其余3种靶板材料,而钨靶板的下游电子温度则较高。中平面附近的电子温度和密度分布也观察到了相似的规律。

快速真空紫外光谱诊断在EAST实验的初步应用

为了在EAST装置上开展高参数放电条件下边界杂质辐射的实验研究,发展了真空紫外(VUV)光谱诊断系统。该系统采用了焦距为200mm的Seya-Namioka型VUV光谱仪,并配备了600g·mm^(-1)凹面全息光栅,所能观测的波长范围为50~700nm,覆盖真空紫外、近紫外和可见光波段。系统在垂直方向的观测范围为Z=-350~350mm。利用该系统开展了EAST边界杂质谱线的实验研究。通过分析CⅣ(154.8nm)杂质和FeⅡ(235nm)的谱线强度的时间演化行为,验证了该系统谱线强度测量的准确性与可靠性。通过分析CⅠ(365.2nm)杂质辐射强度在加热功率调制下的时间演化行为,验证了该系统研究较短时间尺度的杂质辐射行为的可行性。

Line identification of extreme ultraviolet (EUV) spectra from low-Z impurity ions in EAST tokamak plasmas

Extreme ultraviolet(EUV) spectra emitted from low-Z impurity ions in the wavelength range of10–500Å were observed in Experimental Advanced Superconducting Tokamak(EAST)discharges. Several spectral lines from K-and L-shell partially ionized ions were successfully observed with sufficient spectral intensities and resolutions for helium, lithium, boron, carbon,oxygen, neon, silicon and argon using two fast-time-response EUV spectrometers of which the spectral intensities are absolutely calibrated based on the intensity comparison method between visible and EUV bremsstrahlung continua. The wavelength is carefully calibrated using wellknown spectra. The lithium, boron and silicon are individually introduced for the wall coating of the EAST vacuum vessel to suppress mainly the hydrogen and oxygen influxes from the vacuum wall, while the carbon and oxygen intrinsically exist in the plasma. The helium is frequently used as the working gas as well as the deuterium. The neon and argon are also often used for the radiation cooling of edge plasma to reduce the heat flux onto the divertor plate. The measured spectra were analyzed mainly based on the database of National Institute of Standards and Technology. As a result, spectral lines of He Ⅱ, Li Ⅱ–Ⅲ, B Ⅳ–Ⅴ, C Ⅲ–Ⅵ, O Ⅲ–Ⅷ, Ne Ⅱ–Ⅹ,Si Ⅴ–Ⅻ, and Ar Ⅹ–XVI are identified in EAST plasmas of which the central electron temperature and chord-averaged electron density range in Te0=0.6–2.8 keV and ne=(0.5–6.0)×1019 m-3, respectively. The wavelengths and transitions of EUV lines identified here are summarized and listed in a table for each impurity species as the database for EUV spectroscopy using fusion plasmas.

Space-resolved vacuum-ultraviolet spectroscopy for measuring impurity emission from divertor region of EAST tokamak

The measurement of impurity distribution in the divertor region of tokamaks is key to studying edge impurity transport.Therefore,a space-resolved vacuum-ultraviolet(VUV)spectrometer is designed to measure impurity emission in the divertor region on EAST.For good spectral resolution,an eagle-type VUV spectrometer with 1 m long focal length with spherical holograph grating is used in the system.For light collection,a collimating mirror is installed between the EAST plasma and the VUV spectrometer to extend the observing range to cover the upper divertor region.Two types of detectors,i.e.a back-illuminated charge-coupled device detector and a photomultiplier-tube detector,are adopted for the spectral measurement and high-frequency intensity measurement for feedback control,respectively.The angle between the entrance and exit optical axis is fixed at 15°.The detector can be moved along the exit axis to maintain a good focusing position when the wavelength is scanned by rotating the grating.The profile of impurity emissions is projected through the space-resolved slit,which is set horizontally.The spectrometer is equipped with two gratings with 2400 grooves/mm and2160 grooves/mm,respectively.The overall aberration of the system is reduced by accurate detector positioning.As a result,the total spectral broadening can be reduced to about 0.013 nm.The simulated performance of the system is found to satisfy the requirement of measurement of impurity emissions from the divertor area of the EAST tokamak.

Effects of some parameters on the divertor plasma sheath characteristics and fuel retention in castellated tungsten tile gaps

Castellation of plasma facing components is foreseen as the best solution for ensuring the lifetime of future fusion devices. However, the gaps between the resulting surface elements can increase fuel retention and complicate fuel removal issues. To know how the fuel is retained inside the gaps, the plasma sheath around the gaps needs to be understood first. In this work, a kinetic model is used to study plasma characteristics around the divertor gaps with the focus on the H＋ penetration depth inside the poloidal gaps, and a rate-theory model is coupled to simulate the hydrogen retention inside the tungsten gaps. By varying the magnetic field strength and plasma temperature, we find that the H＋ cyclotron radius has a significant effect on the penetration depth. Besides, the increase of magnetic field inclination angle can also increase the penetration depth. It is found in this work that parameters as well as the penetration depth strongly affect fuel retention in tungsten gaps.

Modeling of the impurity-induced silicon nanocone growth by low energy helium plasma irradiation

The formation mechanism of nanocone structure on silicon(Si)surface irradiated by helium plasma has been investigated by experiments and simulations.Impurity(molybdenum)aggregated as shields on Si was found to be a key factor to form a high density of nanocone in our previous study.Here to concrete this theory,a simulation work has been developed with SURO code based on the impurity concentration measurement of the nanocones by using electron dispersive x-ray spectroscopy.The formation process of the nanocone from a flat surface was presented.The modeling structure under an inclining ion incident direction was in good agreement with the experimental result.Moreover,the redeposition effect was proposed as another important process of nanocone formation based on results from the comparison of the cone diameter and sputtering yield between cases with and without the redeposition effect.