在高溅射功率900 W 下用RF磁控溅射方法制备了厚为630-780nm的Fe-Ti-N薄膜,结果表明:当膜成分(原了分数, ％.下同)在Fe-3.9Ti-8.8N和Fe-3.3Ti-13.5N范围内,薄膜由α’和Ti2N沉淀组成,磁化强度4πMs超过纯铁,最商可达2.38T:而矫顽力Hc下...在高溅射功率900 W 下用RF磁控溅射方法制备了厚为630-780nm的Fe-Ti-N薄膜,结果表明:当膜成分(原了分数, ％.下同)在Fe-3.9Ti-8.8N和Fe-3.3Ti-13.5N范围内,薄膜由α’和Ti2N沉淀组成,磁化强度4πMs超过纯铁,最商可达2.38T:而矫顽力Hc下降为89 A/m.可以满足针对1.55 Gb/cm2高存储密度的GMR/感应式复合读写磁头中写入磁头的需要.N原子进入α-Fe使α’具有高饱和磁化强度;Ti的加入,阻止α’→α’+γ’的分解,稳定了强铁磁性相α’.是Fe-Ti-N具有高饱和磁化强度的原因.由于由晶粒度引起的对Hc的影响程度HcD与晶粒度D有以下关系:HcD∝D6,晶粒度控制非常重要.N原了进入α+Fe点阵的八面体间隙,引起极大的畸变,使晶粒碎化.提高溅射功率也使晶粒度下降.两者共同作用,能使晶粒度下降到约14nm,使Hc下降,晶界是择优沉淀地点,在α’晶界上沉淀Ti2N能起钉扎作用,阻止晶界迁移,使纳米晶α’不能长大。展开更多
200 nm Fe-N thin films deposited on glass substrates by RF sputtering were vacuum annealed at 250-350℃ under 12000 A/m magnetic field. Heat treatment was effective in improving the soft magnetic properties of the Fe-...200 nm Fe-N thin films deposited on glass substrates by RF sputtering were vacuum annealed at 250-350℃ under 12000 A/m magnetic field. Heat treatment was effective in improving the soft magnetic properties of the Fe-N film. When the nitrogen content was in the range of 5-7 at. %,the thin films consisted of α′ + α' after heat treatment and had excellent soft magnetic properties of 4πMs = 2.4 T, Hc ＜ 80 A/m, μr = 1500 under 2-10 MHz. The properties of the films meet the needs of a write head material used in the dual element GMR/inductive heads. The fromation mechanism and lattice constants of the α′ phase in Fe-N thin film are different from Jack's results obtained from γ→α′transformation in bulk samples. The linear relationship between a, c and Ca'N for thin film was obtained asc = 2. 866+ 1.559Ca'N,a = 2.866 + 0.181Ca'N.展开更多
文摘200 nm Fe-N thin films deposited on glass substrates by RF sputtering were vacuum annealed at 250-350℃ under 12000 A/m magnetic field. Heat treatment was effective in improving the soft magnetic properties of the Fe-N film. When the nitrogen content was in the range of 5-7 at. %,the thin films consisted of α′ + α' after heat treatment and had excellent soft magnetic properties of 4πMs = 2.4 T, Hc ＜ 80 A/m, μr = 1500 under 2-10 MHz. The properties of the films meet the needs of a write head material used in the dual element GMR/inductive heads. The fromation mechanism and lattice constants of the α′ phase in Fe-N thin film are different from Jack's results obtained from γ→α′transformation in bulk samples. The linear relationship between a, c and Ca'N for thin film was obtained asc = 2. 866+ 1.559Ca'N,a = 2.866 + 0.181Ca'N.
