A diffusion theory model induced by a line source distribution is presented for oblique-incidence reflectometry. By fitting to this asymmetric diffusion model, the absorption and reduced scattering coefficients μs a...A diffusion theory model induced by a line source distribution is presented for oblique-incidence reflectometry. By fitting to this asymmetric diffusion model, the absorption and reduced scattering coefficients μs and μ＇s of the turbid medium can both be determined with accuracy of 10% from the absolute profile of the diffuse reflectance in the incident plane at the negative position -1.5 transport mean free path （mfpt） away from the incident point; particularly, μ＇s can be estimated from the data at positive positions within 0-1.0 mfp＇ with 10% accuracy. The method is verified by Monte Carlo simulations and experimentally tested on a phantom.展开更多
文摘A diffusion theory model induced by a line source distribution is presented for oblique-incidence reflectometry. By fitting to this asymmetric diffusion model, the absorption and reduced scattering coefficients μs and μ＇s of the turbid medium can both be determined with accuracy of 10% from the absolute profile of the diffuse reflectance in the incident plane at the negative position -1.5 transport mean free path （mfpt） away from the incident point; particularly, μ＇s can be estimated from the data at positive positions within 0-1.0 mfp＇ with 10% accuracy. The method is verified by Monte Carlo simulations and experimentally tested on a phantom.
