We report the optical oscillations with monolayer periodicity observed by an oblique-incidence reflectance difference(OIRD)technique on the epitaxial growth of Nb-doped SrTiO_(3) on SrTiO_(3) substrate.The periodicity...We report the optical oscillations with monolayer periodicity observed by an oblique-incidence reflectance difference(OIRD)technique on the epitaxial growth of Nb-doped SrTiO_(3) on SrTiO_(3) substrate.The periodicity was verified by the simultaneously measured reflection high-energy electron diffraction intensity oscillations.The OIRD oscillation damps during deposition,but can recover after the growth is interrupted for some time.We interpret the optical oscillations as a result of the periodic changes of the surface morphologies due to the two-dimensional layer-by-layer growth of thin films.展开更多
基金Supported by the National Natural Science Foundation of China under Grant No.60028404.
文摘We report the optical oscillations with monolayer periodicity observed by an oblique-incidence reflectance difference(OIRD)technique on the epitaxial growth of Nb-doped SrTiO_(3) on SrTiO_(3) substrate.The periodicity was verified by the simultaneously measured reflection high-energy electron diffraction intensity oscillations.The OIRD oscillation damps during deposition,but can recover after the growth is interrupted for some time.We interpret the optical oscillations as a result of the periodic changes of the surface morphologies due to the two-dimensional layer-by-layer growth of thin films.
