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陶瓷靶射频磁控溅射TiO_2薄膜的制备和光催化特性(英文) 被引量:1
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作者 桑敏 刘发民 +2 位作者 丁芃 毋二省 王天民 《功能材料》 EI CAS CSCD 北大核心 2005年第7期1126-1130,共5页
本文采用Ti O2陶瓷靶及射频磁控溅射法在玻璃衬底上制备出了一系列透明Ti O2薄膜,利用X射线衍射(XRD)和原子力显微镜(AFM)对不同衬底温度和溅射功率的Ti O2薄膜结构和形貌进行了表征,结果随着溅射条件的不同会出现锐钛矿或锐钛矿-金红... 本文采用Ti O2陶瓷靶及射频磁控溅射法在玻璃衬底上制备出了一系列透明Ti O2薄膜,利用X射线衍射(XRD)和原子力显微镜(AFM)对不同衬底温度和溅射功率的Ti O2薄膜结构和形貌进行了表征,结果随着溅射条件的不同会出现锐钛矿或锐钛矿-金红石的混合相。利用UV-Vis-Nir分光光度计测得的透射光谱表明随着衬底温度和溅射功率的增加吸收边有一定的红移。薄膜的光催化活性通过对罗丹明B溶液的降解效率来表征,结果表明在550℃和130 W表面出最佳的光催化效果。 展开更多
关键词 TITANIA thin films RF MAGNETRON SPUTTERING ceramic target PHOTOCATALYTIC activity
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Characterization of doped hydrogenated nanocrystalline silicon films prepared by plasma enhanced chemical vapour deposition
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作者 王金良 毋二省 《Chinese Physics B》 SCIE EI CAS CSCD 2007年第3期848-853,共6页
The B- and P-doped hydrogenated nanocrystalline silicon films (nc-Si:H) are prepared by plasma-enhanced chemical vapour deposition (PECVD). The microstructures of doped nc-Si'H films are carefully and systematic... The B- and P-doped hydrogenated nanocrystalline silicon films (nc-Si:H) are prepared by plasma-enhanced chemical vapour deposition (PECVD). The microstructures of doped nc-Si'H films are carefully and systematically characterized by using high resolution electron microscopy (HREM), Raman scattering, x-ray diffraction (XRD), Auger electron spectroscopy (AES), and resonant nucleus reaction (RNR). The results show that as the doping concentration of PH3 increases, the average grain size (d) tends to decrease and the crystalline volume percentage (Xc) increases simultaneously. For the B-doped samples, as the doping concentration of B2H6 increases, no obvious change in the value of d is observed, but the value of Xc is found to decrease. This is especially apparent in the case of heavy B2H6 doped samples, where the films change from nanocrystalline to amorphous. 展开更多
关键词 PECVD doped hydrogenated nanocrystalline silicon film MICROSTRUCTURE
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