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Depositing aluminum as sacrificial metal to reduce metal–graphene contact resistance
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作者 毛达诚 金智 +4 位作者 王少青 张大勇 史敬元 彭松昂 王选芸 《Chinese Physics B》 SCIE EI CAS CSCD 2016年第7期483-487,共5页
Reducing the contact resistance without degrading the mobility property is crucial to achieve high-performance graphene field effect transistors. Also, the idea of modifying the graphene surface by etching away the de... Reducing the contact resistance without degrading the mobility property is crucial to achieve high-performance graphene field effect transistors. Also, the idea of modifying the graphene surface by etching away the deposited metal provides a new angle to achieve this goal. We exploit this idea by providing a new process method which reduces the contact resistance from 597Ω ·μm to sub 200 Ω ·μm while no degradation of mobility is observed in the devices. This simple process method avoids the drawbacks of uncontrollability, ineffectiveness, and trade-off with mobility which often exist in the previously proposed methods. 展开更多
关键词 graphene field effect transistor contact resistance
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