本文中我们采用脉冲激光沉积技术在SrTiO3(001)基底上制备出钙铁石结构的SrCoO2.5(BM-SCO)外延薄膜,在氧气氛围、不同温度下对样品进行后退火工艺处理,使薄膜发生由钙铁石相到钙钛矿相(P-SCO)的拓扑相变。研究结果表明薄膜的磁性和微结...本文中我们采用脉冲激光沉积技术在SrTiO3(001)基底上制备出钙铁石结构的SrCoO2.5(BM-SCO)外延薄膜,在氧气氛围、不同温度下对样品进行后退火工艺处理,使薄膜发生由钙铁石相到钙钛矿相(P-SCO)的拓扑相变。研究结果表明薄膜的磁性和微结构在相变温度(250℃)附近发生很大的变化。当退火温度为250℃ ≤ T 3–δ。XPS拟合结果显示,退火后Co的价态发生变化,从Co3+转变为Co4+,即薄膜中的部分氧空位被填充。故退火后钙钛矿型SrCoO3–δ的氧含量(3–δ)约为2.75。展开更多
We re-visit the anomalous sign reversal problem in the Hall effect of the sputtered Nb thin films. We find that the anomalous sign reversal in the Hall effect is extremely sensitive to a small tilting of the magnetic ...We re-visit the anomalous sign reversal problem in the Hall effect of the sputtered Nb thin films. We find that the anomalous sign reversal in the Hall effect is extremely sensitive to a small tilting of the magnetic field and to the magnitude of the applied current. Large anomalous variations are also observed in the symmetric part of the transverse resistance R_(xy).We suggest that the surface current loops on superconducting grains at the edges of the superconducting thin films may be responsible for the Hall sign reversal and the accompanying anomalous effects in the symmetric part of R_(xy).展开更多
文摘本文中我们采用脉冲激光沉积技术在SrTiO3(001)基底上制备出钙铁石结构的SrCoO2.5(BM-SCO)外延薄膜,在氧气氛围、不同温度下对样品进行后退火工艺处理,使薄膜发生由钙铁石相到钙钛矿相(P-SCO)的拓扑相变。研究结果表明薄膜的磁性和微结构在相变温度(250℃)附近发生很大的变化。当退火温度为250℃ ≤ T 3–δ。XPS拟合结果显示,退火后Co的价态发生变化,从Co3+转变为Co4+,即薄膜中的部分氧空位被填充。故退火后钙钛矿型SrCoO3–δ的氧含量(3–δ)约为2.75。
基金partially supported by the National Natural Science Foundation of China (Grant No. 51772200) (PI: R. J. Tang)。
文摘We re-visit the anomalous sign reversal problem in the Hall effect of the sputtered Nb thin films. We find that the anomalous sign reversal in the Hall effect is extremely sensitive to a small tilting of the magnetic field and to the magnitude of the applied current. Large anomalous variations are also observed in the symmetric part of the transverse resistance R_(xy).We suggest that the surface current loops on superconducting grains at the edges of the superconducting thin films may be responsible for the Hall sign reversal and the accompanying anomalous effects in the symmetric part of R_(xy).