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面心立方金属和合金中的碳内耗峰 被引量:2
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作者 王其闵 《物理学进展》 CSCD 北大核心 1989年第4期411-428,共18页
本文从理论上和实验上总结和阐明了面心立方金属和合金中碳内耗峰的物理机构,以间隙碳-空位碳原子对模型来解释面心纯金属中的碳内耗峰,以MV-CC,金属原子(M)-空位碳(V-C)-间隙碳(C),原子团模型来说明面心合金中的碳峰。
关键词 金属 合金 碳内耗峰
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金刚石研究的历史进展——单晶金刚石薄膜
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作者 王其闵 《科学中国人》 2000年第10期14-15,共2页
人类在很早以前就发现了天然金刚石,虽然在自然界可以找到很大的金刚石晶体,但数量很少,很昂贵,只能作装饰品,为皇冠上的明珠,不能大量工业应用。1959年英国的M·P·Bovenkerk等用人造方法在高温高压下合成金刚石颗粒获得成功,... 人类在很早以前就发现了天然金刚石,虽然在自然界可以找到很大的金刚石晶体,但数量很少,很昂贵,只能作装饰品,为皇冠上的明珠,不能大量工业应用。1959年英国的M·P·Bovenkerk等用人造方法在高温高压下合成金刚石颗粒获得成功,为工业上大量应用金刚石颗粒开辟了道路,为制作切削工具, 展开更多
关键词 金刚石研究 单晶金刚石薄膜 制备 高湿异质外延法生长
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Heteroepitaxial Growth of Single-Crystalline Diamond Film
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作者 WANG Qi-min CHEN Qing-gui +3 位作者 SHI Ri-hua DONG Rong-kang NI Ru-shan ZHU Ji-qian 《Chinese Physics Letters》 SCIE CAS CSCD 1998年第11期819-821,共3页
Using high temperature heteroepitaxial growth method the single-crystalline diamond film growth conditions have been studied by Raman spectrum and transmission electron diffraction.High temperature,low alcohol concent... Using high temperature heteroepitaxial growth method the single-crystalline diamond film growth conditions have been studied by Raman spectrum and transmission electron diffraction.High temperature,low alcohol concentration,slow gas flow velocity,long epitaxial time and substrate located near the gas exit side on the susceptor are the favourable conditions for growing single-crystalline diamond film. 展开更多
关键词 diffraction. film. EPITAXIAL
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ACTIVATION ENERGY OF ELECTROMIGRATION IN THIN METAL FILMS
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作者 WANG Qimin WU Yunzhong SUN Chenglong 《Chinese Physics Letters》 SCIE CAS 1986年第2期65-68,共4页
A new method for measuring the activation energy of electromigration in thin metal films has been established.
关键词 ACTIVATION FILMS METHOD
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STAGNANT LAYER EFFECT IN CVD PROCESS
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作者 王其闵 章熙康 顾隆道 《Science China Chemistry》 SCIE EI CAS 1986年第4期353-363,共11页
It is clearly shown that the stagnant layer effect is present in entire temperature range in CVD process by pyrolysis of silane. The Curves in logarithmic growth rate vs reciprocal temperature plot can be divided into... It is clearly shown that the stagnant layer effect is present in entire temperature range in CVD process by pyrolysis of silane. The Curves in logarithmic growth rate vs reciprocal temperature plot can be divided into three straight line ranges. In high temperature region the rate-controlling mechanism is the diffusion of silicon atoms, but not of silane, which pass through the stagnant layer after thermal decomposition of silane. In intermediate and low temperature region the growth rate-controlling factor is the decomposition rate of silane in the stagnant layer, but not the surface reaction process. Owing to the difference in ratecontrolling mechanism the growth rate has different dependences on the height of stagnant layer. In intermediate and low temperature region the growth rate is proportional to the stagnant layer height, but in high temperature region it is inversely proportional to the square of the stagnant layer height. 展开更多
关键词 STAGNANT LAYER EFFECT IN CVD PROCESS RATE CVD
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