Highly charged^(129)Xe^(q+)(q=10-30)and^(40)Ne^(q+)(q=4-8)ion-induced secondary electron emissions on the surface of highly oriented pyrolytic graphite(HOPG)are reported.The total secondary electron yield is measured ...Highly charged^(129)Xe^(q+)(q=10-30)and^(40)Ne^(q+)(q=4-8)ion-induced secondary electron emissions on the surface of highly oriented pyrolytic graphite(HOPG)are reported.The total secondary electron yield is measured as a function of the potential energy of incident ions.The experimental data are used to separate contributions of kinetic and potential electron yields.Our results show that about 4.5%and 13.2%of ion's potential energies are consumed in potential electron emission due to different Xe^(q+)-HOPG and Ne^(q+)-HOPG combinations.A simple formula is introduced to estimate the fraction of ion's potential energy for potential electron emission.展开更多
基金Supported by the National Natural Science Foundation of China under Grant Nos 10805063 and 10905079National Basic Research Program of China under Grant No 2010CB832902.
文摘Highly charged^(129)Xe^(q+)(q=10-30)and^(40)Ne^(q+)(q=4-8)ion-induced secondary electron emissions on the surface of highly oriented pyrolytic graphite(HOPG)are reported.The total secondary electron yield is measured as a function of the potential energy of incident ions.The experimental data are used to separate contributions of kinetic and potential electron yields.Our results show that about 4.5%and 13.2%of ion's potential energies are consumed in potential electron emission due to different Xe^(q+)-HOPG and Ne^(q+)-HOPG combinations.A simple formula is introduced to estimate the fraction of ion's potential energy for potential electron emission.
