The design and test results of a 6-bit 3-Gsps analog-to-digital converter （ADC） using 1 μm GaAs het- erojunction bipolar transistor （HBT） technology are presented. The monolithic folding-interpolating ADC makes u...The design and test results of a 6-bit 3-Gsps analog-to-digital converter （ADC） using 1 μm GaAs het- erojunction bipolar transistor （HBT） technology are presented. The monolithic folding-interpolating ADC makes use of a track-and-hold amplifier （THA） with a highly linear input buffer to maintain a highly effective number of bits （ENOB）. The ADC occupies an area of 4.32 × 3.66 mm2 and achieves 5.53 ENOB with an effective resolution bandwidth of 1.l GHz at a sampling rate of 3 Gsps. The maximum DNL and INL are 0.36 LSB and 0.48 LSB, respectively.展开更多
基金Project supported by the National Basic Research Program of China(No.2010CB327505)the Advance Research Project of China(No.51308xxxx06)the Advance Research Foundation of China(No.9140A08xxxx11DZ111)
文摘The design and test results of a 6-bit 3-Gsps analog-to-digital converter （ADC） using 1 μm GaAs het- erojunction bipolar transistor （HBT） technology are presented. The monolithic folding-interpolating ADC makes use of a track-and-hold amplifier （THA） with a highly linear input buffer to maintain a highly effective number of bits （ENOB）. The ADC occupies an area of 4.32 × 3.66 mm2 and achieves 5.53 ENOB with an effective resolution bandwidth of 1.l GHz at a sampling rate of 3 Gsps. The maximum DNL and INL are 0.36 LSB and 0.48 LSB, respectively.
