As the film thickness is an important factor in the study of evaporated films, we have been looking for a convenient and nondestructive method of film thickness measurement. The infrared interferometric method which h...As the film thickness is an important factor in the study of evaporated films, we have been looking for a convenient and nondestructive method of film thickness measurement. The infrared interferometric method which has been used for thickness measurement of the epitaxical growth of silicon, gives the optical thickness, i.e. the product of refractive index and thickness. In order to get the refractive index of αI-展开更多
The crystallite orientation of the evaporated film of copper phthalocyanine (PcCu) has a great effect on its electrical conduction properties. Many authors have studied the structure of the film, and obtained differen...The crystallite orientation of the evaporated film of copper phthalocyanine (PcCu) has a great effect on its electrical conduction properties. Many authors have studied the structure of the film, and obtained different results in relative strengths of X-ray diffraction peaks showing different crystallite orientations. The展开更多
文摘As the film thickness is an important factor in the study of evaporated films, we have been looking for a convenient and nondestructive method of film thickness measurement. The infrared interferometric method which has been used for thickness measurement of the epitaxical growth of silicon, gives the optical thickness, i.e. the product of refractive index and thickness. In order to get the refractive index of αI-
文摘The crystallite orientation of the evaporated film of copper phthalocyanine (PcCu) has a great effect on its electrical conduction properties. Many authors have studied the structure of the film, and obtained different results in relative strengths of X-ray diffraction peaks showing different crystallite orientations. The