The random telegraph signal noise in the pixel source follower MOSFET is the principle component of the noise in the CMOS image sensor under low light. In this paper, the physical and statistical model of the random t...The random telegraph signal noise in the pixel source follower MOSFET is the principle component of the noise in the CMOS image sensor under low light. In this paper, the physical and statistical model of the random telegraph signal noise in the pixel source follower based on the binomial distribution is set up. The number of electrons captured or released by the oxide traps in the unit time is described as the random variables which obey the binomial distribution. As a result,the output states and the corresponding probabilities of the first and the second samples of the correlated double sampling circuit are acquired. The standard deviation of the output states after the correlated double sampling circuit can be obtained accordingly. In the simulation section, one hundred thousand samples of the source follower MOSFET have been simulated,and the simulation results show that the proposed model has the similar statistical characteristics with the existing models under the effect of the channel length and the density of the oxide trap. Moreover, the noise histogram of the proposed model has been evaluated at different environmental temperatures.展开更多
Dark count is one of the inherent noise types in single-photon diodes,which may restrict the performances of detectors based on these diodes.To formulate better designs for peripheral circuits of such diodes,an accura...Dark count is one of the inherent noise types in single-photon diodes,which may restrict the performances of detectors based on these diodes.To formulate better designs for peripheral circuits of such diodes,an accurate statistical behavioral model of dark current must be established.Research has shown that there are four main mechanisms that contribute to the dark count in single-photon avalanche diodes.However,in the existing dark count models only three models have been considered,thus leading to inaccuracies in these models.To resolve these shortcomings,the dark current caused by carrier diffusion in the neutral region is deduced by multiplying the carrier detection probability with the carrier particle current at the boundary of the depletion layer.Thus,a comprehensive dark current model is constructed by adding the dark current caused by carrier diffusion to the dark current caused by the other three mechanisms.To the best of our knowledge,this is the first dark count simulation model into which incorporated simultaneously are the thermal generation,trap-assisted tunneling,band-to-band tunneling mechanisms,and carrier diffusion in neutral regions to evaluate dark count behavior.The comparison between the measured data and the simulation results from the models shows that the proposed model is more accurate than other existing models,and the maximum of accuracy increases up to 31.48%when excess bias voltage equals 3.5 V and temperature is 50℃.展开更多
基金Project supported by the National Natural Science Foundation of China(Grant Nos.61372156 and 61405053)the Natural Science Foundation of Zhejiang Province of China(Grant No.LZ13F04001)
文摘The random telegraph signal noise in the pixel source follower MOSFET is the principle component of the noise in the CMOS image sensor under low light. In this paper, the physical and statistical model of the random telegraph signal noise in the pixel source follower based on the binomial distribution is set up. The number of electrons captured or released by the oxide traps in the unit time is described as the random variables which obey the binomial distribution. As a result,the output states and the corresponding probabilities of the first and the second samples of the correlated double sampling circuit are acquired. The standard deviation of the output states after the correlated double sampling circuit can be obtained accordingly. In the simulation section, one hundred thousand samples of the source follower MOSFET have been simulated,and the simulation results show that the proposed model has the similar statistical characteristics with the existing models under the effect of the channel length and the density of the oxide trap. Moreover, the noise histogram of the proposed model has been evaluated at different environmental temperatures.
基金Project supported by the Natural Science Foundation of Zhejiang Province,China(Grant No.LY17F010022)the National Natural Science Foundation of China(Grant No.61372156)。
文摘Dark count is one of the inherent noise types in single-photon diodes,which may restrict the performances of detectors based on these diodes.To formulate better designs for peripheral circuits of such diodes,an accurate statistical behavioral model of dark current must be established.Research has shown that there are four main mechanisms that contribute to the dark count in single-photon avalanche diodes.However,in the existing dark count models only three models have been considered,thus leading to inaccuracies in these models.To resolve these shortcomings,the dark current caused by carrier diffusion in the neutral region is deduced by multiplying the carrier detection probability with the carrier particle current at the boundary of the depletion layer.Thus,a comprehensive dark current model is constructed by adding the dark current caused by carrier diffusion to the dark current caused by the other three mechanisms.To the best of our knowledge,this is the first dark count simulation model into which incorporated simultaneously are the thermal generation,trap-assisted tunneling,band-to-band tunneling mechanisms,and carrier diffusion in neutral regions to evaluate dark count behavior.The comparison between the measured data and the simulation results from the models shows that the proposed model is more accurate than other existing models,and the maximum of accuracy increases up to 31.48%when excess bias voltage equals 3.5 V and temperature is 50℃.
