We employed the microscopic reflectance difference spectroscopy （micro-RDS） to determine the layer- number and microscopically image the surface topography of graphene and MoS2 samples. The contrast image shows the ...We employed the microscopic reflectance difference spectroscopy （micro-RDS） to determine the layer- number and microscopically image the surface topography of graphene and MoS2 samples. The contrast image shows the efficiency and reliability of this new clipping technique. As a low-cost, quantifiable, no-contact and non-destructive method, it is not concerned with the characteristic signal of certain materials and can be applied to arbitrary substrates. Therefore it is a perfect candidate for characterizing the thickness of graphene-like two- dimensional materials.展开更多
基金supported by the State Key Development Program for Basic Research of China(Nos.2012CB921304,2013CB632805,2012CB619306)the National Natural Science Foundation of China(No.61474114)
文摘We employed the microscopic reflectance difference spectroscopy （micro-RDS） to determine the layer- number and microscopically image the surface topography of graphene and MoS2 samples. The contrast image shows the efficiency and reliability of this new clipping technique. As a low-cost, quantifiable, no-contact and non-destructive method, it is not concerned with the characteristic signal of certain materials and can be applied to arbitrary substrates. Therefore it is a perfect candidate for characterizing the thickness of graphene-like two- dimensional materials.
