We develop an element-specific x-ray microscopy method by using Zernike phase contrast imaging near absorption edges, where a real part of refractive index changes abruptly. In this method two phase contrast images ar...We develop an element-specific x-ray microscopy method by using Zernike phase contrast imaging near absorption edges, where a real part of refractive index changes abruptly. In this method two phase contrast images are subtracted to obtain the target element: one is at the absorption edge of the target element and the other is near the absorption edge. The x-ray exposure required by this method is expected to be significantly lower than that of conventional absorption-based x-ray elemental imaging methods. Numerical calculations confirm the advantages of this highly efficient imaging method.展开更多
基金Supported by the Major State Basic Research Development Program(2012CB825800)the Science Fund for Creative Research Groups(11321503)+2 种基金the Knowledge Innovation Program of the Chinese Academy of Sciences(KJCX2-YWN42)the National Natural Science Foundation of China(11179004,10979055,11205189,and 11205157)the Fundamental Research Funds for the Central Universities(WK2310000021)
基金supported by the National Basic Research Program of China(Grant No.2012CB825801)the National Natural Science Foundation of China(Grant Nos.11505188,and 11305173)
文摘We develop an element-specific x-ray microscopy method by using Zernike phase contrast imaging near absorption edges, where a real part of refractive index changes abruptly. In this method two phase contrast images are subtracted to obtain the target element: one is at the absorption edge of the target element and the other is near the absorption edge. The x-ray exposure required by this method is expected to be significantly lower than that of conventional absorption-based x-ray elemental imaging methods. Numerical calculations confirm the advantages of this highly efficient imaging method.
