A faceted defect has been found in some ZMR SOI multilayer compositematerials as a result of melting and recrystallization of silicon substrate at some isolat-ed spots of its top in ZMR processing.The temperature devi...A faceted defect has been found in some ZMR SOI multilayer compositematerials as a result of melting and recrystallization of silicon substrate at some isolat-ed spots of its top in ZMR processing.The temperature deviation tolerance of thermalfield is predicted and,based on it,some suggestions on improving the multilayerstructure design are put forward.Finally,a model interpreting the defect formationis described,which leads to a qualitative explanation of the defect features.展开更多
文摘A faceted defect has been found in some ZMR SOI multilayer compositematerials as a result of melting and recrystallization of silicon substrate at some isolat-ed spots of its top in ZMR processing.The temperature deviation tolerance of thermalfield is predicted and,based on it,some suggestions on improving the multilayerstructure design are put forward.Finally,a model interpreting the defect formationis described,which leads to a qualitative explanation of the defect features.