针对ISO 21254中1 on 1损伤阈值测试结果的测量不确定度评估需求,系统性分析测量结果不确定度的主要影响因素。采用公式法分析评定能量密度的测量不确定度以及损伤概率的测量不确定度分量。采用蒙特卡洛方法分析了线性拟合引入的测量不...针对ISO 21254中1 on 1损伤阈值测试结果的测量不确定度评估需求,系统性分析测量结果不确定度的主要影响因素。采用公式法分析评定能量密度的测量不确定度以及损伤概率的测量不确定度分量。采用蒙特卡洛方法分析了线性拟合引入的测量不确定度,并对比分析了线性拟合过程中不同残差模型对损伤概率、能量密度线性拟合结果的影响。分析表明,在线性拟合过程中,基于损伤概率、能量密度误差的最小二乘法残差模型抗误差性能最好,可有效降低损伤概率误差及能量密度误差对损伤阈值测量结果影响。采用ISO 21254推荐的方法和蒙特卡洛方法处理同一损伤测试实验数据,结果对比表明ISO 21254方法获得的阈值测量不确定度偏小、阈值测量结果偏大,实际测试过程中容易高估样品损伤阈值。展开更多
This Letter is concerned with the influence of polarization on the damage performance of type I doubler potas- sium dihydrogen phosphate crystals grown by the conventional growth method under 532 nm pulse irradiation....This Letter is concerned with the influence of polarization on the damage performance of type I doubler potas- sium dihydrogen phosphate crystals grown by the conventional growth method under 532 nm pulse irradiation. Pinpoint density （ppd） and the size distribution of pinpoints are extracted through light scattering pictures captured by microscope. The results show that the ppd of polarization that parallels the extraordinary axis is around 1.5 × less than that of polarization that parallels the ordinary axis under the same fluence, although polarization has no influence on size distribution of pinpoints. We also find that the size distribution is independent of fluence, although the number of pinpoints grows with fluence.展开更多
文摘This Letter is concerned with the influence of polarization on the damage performance of type I doubler potas- sium dihydrogen phosphate crystals grown by the conventional growth method under 532 nm pulse irradiation. Pinpoint density （ppd） and the size distribution of pinpoints are extracted through light scattering pictures captured by microscope. The results show that the ppd of polarization that parallels the extraordinary axis is around 1.5 × less than that of polarization that parallels the ordinary axis under the same fluence, although polarization has no influence on size distribution of pinpoints. We also find that the size distribution is independent of fluence, although the number of pinpoints grows with fluence.
