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一种新型消除失调电压的高速高精度比较器 被引量:1
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作者 郭潘杰 《河南科技》 2017年第17期45-47,共3页
本文提出一种新型消除失调电压的高速高精度CMOS比较器。该比较器克服传统消除失调技术在信号通路引入电容的缺陷,具有更快的速度。设计的比较器采用TSMC 0.35μm 2P4M工艺。采用CADENCE软件SPECTRE仿真器仿真,该比较器在64MHz的时钟频... 本文提出一种新型消除失调电压的高速高精度CMOS比较器。该比较器克服传统消除失调技术在信号通路引入电容的缺陷,具有更快的速度。设计的比较器采用TSMC 0.35μm 2P4M工艺。采用CADENCE软件SPECTRE仿真器仿真,该比较器在64MHz的时钟频率下,失调电压减小了92.6%,其延时时间仅为2.68ns,最小分辨率为33μV。 展开更多
关键词 比较器 前置放大器 消除失调技术
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A 12-bit 1MS/s SAR-ADC for multi-channel CdZnTe detectors
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作者 刘伟 魏廷存 +2 位作者 李博 郭潘杰 胡永才 《Journal of Semiconductors》 EI CAS CSCD 2015年第4期143-150,共8页
This paper presents a low power, area-efficient and radiation-hardened 12-bit 1 MS/s successive approx- imation register (SAR) analog-to-digital converter (ADC) for multi-channel CdZnTe (CZT) detector applicatio... This paper presents a low power, area-efficient and radiation-hardened 12-bit 1 MS/s successive approx- imation register (SAR) analog-to-digital converter (ADC) for multi-channel CdZnTe (CZT) detector applications. In order to improve the SAR-ADC's accuracy, a novel comparator is proposed in which the offset voltage is self- calibrated and also a new architecture for the unit capacitor array is proposed to reduce the capacitance mismatches in the charge-redistribution DAC. The ability to radiation-harden the SAR-ADC is enhanced through circuit and layout design technologies. The prototype chip was fabricated using a TSMC 0.35 μm 2P4M CMOS process. At a 3.3/5 V power supply and a sampling rate of 1 MS/s, the proposed SAR-ADC achieves a peak signal to noise and distortion ratio (SINAD) of 67.64 dB and consumes only 10 mW power. The core of the prototype chip occupies an active area of 1180 ×1080μm2. 展开更多
关键词 SAR ADC radiation-hardness low power CZT detectors
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