XPS study was carried out on Cu/SiO_(2) interface following the irradiation of 6.0MeV Siion beam.The chemical shift in the copper spectra reveals for the first time the existence of a chemically bonded structure in th...XPS study was carried out on Cu/SiO_(2) interface following the irradiation of 6.0MeV Siion beam.The chemical shift in the copper spectra reveals for the first time the existence of a chemically bonded structure in the interface region resulting from ion irradiation.展开更多
文摘XPS study was carried out on Cu/SiO_(2) interface following the irradiation of 6.0MeV Siion beam.The chemical shift in the copper spectra reveals for the first time the existence of a chemically bonded structure in the interface region resulting from ion irradiation.