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3C-SiC各向异性行为的原位纳米划痕研究
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作者 黄俊全 陈宇君 +10 位作者 王冲 李鹏辉 仝柯 康梦克 靳天野 胡文涛 陈俊云 马梦冬 徐波 聂安民 田永君 《Science China Materials》 SCIE EI CAS CSCD 2023年第11期4326-4333,共8页
立方碳化硅(3C-SiC)是一种在极端条件下具有优异机械和物理性能的理想材料.然而,由于其生长深度有限且脆性较高,研究其材料去除和摩擦性能具有一定的挑战性.在本研究中,我们使用扫描电子显微镜对厚度约为20μm的3C-SiC单晶进行了原位纳... 立方碳化硅(3C-SiC)是一种在极端条件下具有优异机械和物理性能的理想材料.然而,由于其生长深度有限且脆性较高,研究其材料去除和摩擦性能具有一定的挑战性.在本研究中,我们使用扫描电子显微镜对厚度约为20μm的3C-SiC单晶进行了原位纳米划痕研究,并观察了其各向异性行为.随后在(100)平面上沿[110]和[100]方向分别进行了纳米划痕实验.与[100]方向相比,[110]方向在划痕过程中表现出更高的硬度,导致材料去除率较低和摩擦系数较高.通过对划痕沟槽的原子级分辨观察,我们发现3C-SiC的塑性去除是通过位错滑移和显著的晶格畸变实现的.在塑性变形阶段,两个划痕方向的亚表面主要经历了全位错滑移.此外,强烈的应变导致了多晶化,这是3C-SiC中的一个重要变形机制. 展开更多
关键词 3C-SIC in situ nano-scratching scanning electron microscope ANISOTROPY
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Atomic-scale observation of the deformation and failure of diamonds by in-situ double-tilt mechanical testing transmission electron microscope holder 被引量:2
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作者 Yizhi Zhang Yeqiang Bu +4 位作者 Junquan Huang Tianye Jin Anmin Nie Hongtao Wang Yongjun Tian 《Science China Materials》 SCIE EI CSCD 2020年第11期2335-2343,共9页
In-situ transmission electron microscopy(TEM)has been demonstrated to be a powerful method in resolving challenging problems such as interactions among various defects.To take advantage of the atomic resolution of adv... In-situ transmission electron microscopy(TEM)has been demonstrated to be a powerful method in resolving challenging problems such as interactions among various defects.To take advantage of the atomic resolution of advanced TEMs,a compact five-degree-of-freedom nanomanipulator was integrated with an indenter that was made of nanotwinned diamonds,for both the in-situ mechanical testing and double tilting of TEM samples.As a demonstration,in-situ bending tests were performed on the?111?,?110?and?100?single-crystal diamond needles.The tests revealed the{111}cleavage to be the dominant failure mode.The in-situ indentation on a diamond nanoplate led to curved cracks consisting of nanometer-scale steps,which were identified to be atomic flat{111}facets.The atomic-scale observation of the deformation and failure of diamonds demonstrated the stability of the entire system and the durability of the indenter.We expect that more delicate research can be carried out by means of this holder in the near future,including in-situ stimulation,atomic characterization,and tomography. 展开更多
关键词 mechanical testing holder double tilt DIAMOND in situ TEM TOMOGRAPHY
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