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Performance improvement of InGaN/GaN multiple quantum well visible-light photodiodes by optimizing TEGa flow 被引量:1
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作者 黎斌 黄善津 +4 位作者 王海龙 吴华龙 吴志盛 王钢 江灏 《Chinese Physics B》 SCIE EI CAS CSCD 2017年第8期423-428,共6页
The performance of an InGaN/GaN multiple quantum well(MQW) based visible-light Schottky photodiode(PD)is improved by optimizing the source flow of TEGa during In Ga N QW growth. The samples with five-pair InGaN/Ga... The performance of an InGaN/GaN multiple quantum well(MQW) based visible-light Schottky photodiode(PD)is improved by optimizing the source flow of TEGa during In Ga N QW growth. The samples with five-pair InGaN/GaN MQWs are grown on sapphire substrates by metal organic chemical vapor deposition. From the fabricated Schottky-barrier PDs, it is found that the smaller the TEGa flow, the lower the reverse-bias leakage is. The photocurrent can also be enhanced by depositing the In GaN QWs with using lower TEGa flow. A high responsivity of 1.94 A/W is obtained at 470 nm and -3-V bias in the PD grown with optimized TEGa flow. Analysis results show that the lower TEGa flow used for depositing In Ga N may lead to superior crystalline quality with improved InGaN/GaN interface, and less structural defects related non-radiative recombination centers formed in the MQWs. 展开更多
关键词 visible-light photodiodes quantum wells triethylgallium oxidized iridium
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