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Temperature dependence of the ionization coefficients of InAlAs and AlGaAs digital alloys 被引量:1
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作者 YUAN YUAN JIYUAN ZHENG +5 位作者 YAOHUA TAN YIWEI PENG ann-kathryn rockwell SETH R. BANK AVIK GHOSH JOE C. CAMPBELL 《Photonics Research》 SCIE EI 2018年第8期794-799,共6页
Digital alloy In_(0.52)Al_(0.48) As avalanche photodiodes exhibit lower excess noise than those fabricated from random alloys. This paper compares the temperature dependence, from 203 to 323 K, of the impact ionizatio... Digital alloy In_(0.52)Al_(0.48) As avalanche photodiodes exhibit lower excess noise than those fabricated from random alloys. This paper compares the temperature dependence, from 203 to 323 K, of the impact ionization characteristics of In_(0.52)Al_(0.48) As and Al_(0.74)Ga_(0.26) As digital and random alloys. These results provide insight into the low excess noise exhibited by some digital alloy materials, and these materials can even obtain lower excess noise at low temperature. 展开更多
关键词 超额噪声 通讯技术 发展现状 技术创新
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