期刊文献+
共找到2篇文章
< 1 >
每页显示 20 50 100
New Model for Drain and Gate Current of Single-Electron Transistor at High Temperature
1
作者 amine touati Samir Chatbouri +1 位作者 Nabil Sghaier Adel Kalboussi 《World Journal of Nano Science and Engineering》 2012年第4期171-175,共5页
We propose a novel analytical model to describe the drain-source current as well as gate-source of single-electron transistors (SETs) at high temperature. Our model consists on summing the tunnel current and thermioni... We propose a novel analytical model to describe the drain-source current as well as gate-source of single-electron transistors (SETs) at high temperature. Our model consists on summing the tunnel current and thermionic contribution. This model will be compared with another model. 展开更多
关键词 SINGLE-ELECTRON Transistor (SET) MASTER Equation ORTHODOX Theory Tunnel CURRENT Thermionic CURRENT SIMON
下载PDF
Study of Two One-Dimensional Multi Tunnel Junctions Arrays Structures by SIMON
2
作者 amine touati Samir Chatbouri +1 位作者 Nabil Sghaier Adel Kalboussi 《World Journal of Nano Science and Engineering》 2012年第4期176-180,共5页
Multi Tunnel Junctions (MTJs) have attracted much attention recently in the fields of Single-Electron Transistor (SET) and Single-Electron Memory (SEM). In this paper, we investigate a nano-device structure using a tw... Multi Tunnel Junctions (MTJs) have attracted much attention recently in the fields of Single-Electron Transistor (SET) and Single-Electron Memory (SEM). In this paper, we investigate a nano-device structure using a two one dimensional array MTJs connected to the basic Single Electron Circuits, in order to analyze the impact of physical parameters on the performances and application of this structure. The device generates can operate at room temperature. The simulation of single-electron circuit demonstrates with Monte Carlo simulator, SIMON. 展开更多
关键词 MULTI Tunnel JUNCTIONS (MTJs) COULOMB BLOCKADE Effect Effective CAPACITANCES SIMON Simulator
下载PDF
上一页 1 下一页 到第
使用帮助 返回顶部