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Optical Methods in Orientation of High-Purity Germanium Crystal
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作者 Guojian Wang Yongchen Sun +4 位作者 Yutong Guan Dongming Mei Gang Yang angela alanson chiller Bruce Gray 《Journal of Crystallization Process and Technology》 2013年第2期60-63,共4页
Two optical methods, namely crystal facet reflection and etching pits reflection, were used to orient and high-purity germanium crystals. The X-ray diffraction patterns of three slices that were cut from the oriented ... Two optical methods, namely crystal facet reflection and etching pits reflection, were used to orient and high-purity germanium crystals. The X-ray diffraction patterns of three slices that were cut from the oriented and crystals were measured by X-ray diffraction. The experimental errors of crystal facet reflection method and etching pits reflection method are in the range of 0.05° - 0.12°. The crystal facet reflection method and etching pits reflection method are extremely simple and cheap and their accuracies are acceptable for characterizing high purity detector-grade germanium crystals. 展开更多
关键词 REFLECTION METHOD HIGH-PURITY GERMANIUM CRYSTAL
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