In this work,thin films of nickel oxide(NiO)were deposited by a simple and inexpensive technique,which is spray pyrolysis on ordinary glass substrates heated to a fixed temperature of500°C,from a solution contain...In this work,thin films of nickel oxide(NiO)were deposited by a simple and inexpensive technique,which is spray pyrolysis on ordinary glass substrates heated to a fixed temperature of500°C,from a solution containing nickel nitrate hexahydrate as a precursor dissolved in distilled water with deferent values of concentrations.The NiO thin films obtained were characterized to determine the structure with X-ray diffraction technique(XRD),the absorption domain(UV-Visible Spectroscopy),and the surface morphology(SEM).The X-ray diffraction patterns confirm the presence of NiO phase with preferential orientation along the(111)direction.The optical gap for nickel oxide calculated with a concentration of0.1M from the measurement of optical absorption is3.6eV,which is quite comparable to the value of the ratio.展开更多
文摘In this work,thin films of nickel oxide(NiO)were deposited by a simple and inexpensive technique,which is spray pyrolysis on ordinary glass substrates heated to a fixed temperature of500°C,from a solution containing nickel nitrate hexahydrate as a precursor dissolved in distilled water with deferent values of concentrations.The NiO thin films obtained were characterized to determine the structure with X-ray diffraction technique(XRD),the absorption domain(UV-Visible Spectroscopy),and the surface morphology(SEM).The X-ray diffraction patterns confirm the presence of NiO phase with preferential orientation along the(111)direction.The optical gap for nickel oxide calculated with a concentration of0.1M from the measurement of optical absorption is3.6eV,which is quite comparable to the value of the ratio.
