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Influence of self-heating on the millimeter-wave and terahertz performance of MBE grown silicon IMPATT diodes
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作者 S.J.Mukhopadhyay Prajukta Mukherjee +1 位作者 aritra acharyya Monojit Mitra 《Journal of Semiconductors》 EI CAS CSCD 2020年第3期13-22,共10页
The influence of self-heating on the millimeter-wave(mm-wave)and terahertz(THz)performance of double-drift region(DDR)impact avalanche transit time(IMPATT)sources based on silicon(Si)has been investigated in this pape... The influence of self-heating on the millimeter-wave(mm-wave)and terahertz(THz)performance of double-drift region(DDR)impact avalanche transit time(IMPATT)sources based on silicon(Si)has been investigated in this paper.The dependences of static and large-signal parameters on junction temperature are estimated using a non-sinusoidal voltage excited(NSVE)large-signal simulation technique developed by the authors,which is based on the quantum-corrected drift-diffusion(QCDD)model.Linear variations of static parameters and non-linear variations of large-signal parameters with temperature have been observed.Analytical expressions representing the temperature dependences of static and large-signal parameters of the diodes are developed using linear and 2nd degree polynomial curve fitting techniques,which will be highly useful for optimizing the thermal design of the oscillators.Finally,the simulated results are found to be in close agreement with the experimentally measured data. 展开更多
关键词 IMPATT oscillators linear temperature coefficient SELF-HEATING thermal runway quadratic temperature coefficient
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Effect of junction temperature on the large-signal properties of a 94 GHz silicon based double-drift region impact avalanche transit time device 被引量:6
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作者 aritra acharyya Suranjana Banerjee J.P.Banerjee 《Journal of Semiconductors》 EI CAS CSCD 2013年第2期19-30,共12页
The authors have developed a large-signal simulation technique extending an in-house small-signal simulation code for analyzing a 94 GHz double-drift region impact avalanche transit time device based on silicon with a... The authors have developed a large-signal simulation technique extending an in-house small-signal simulation code for analyzing a 94 GHz double-drift region impact avalanche transit time device based on silicon with a non-sinusoidal voltage excitation and studied the effect of junction temperature between 300 and 550 K on the large-signal characteristics of the device for both continuous wave (CW) and pulsed modes of operation. Results show that the large-signal RF power output of the device in both CW and pulsed modes increases with the increase of voltage modulation factor up to 60%, but decreases sharply with further increase of voltage modulation factor for a particular junction temperature; while the same parameter increases with the increase of junction temperature for a particular voltage modulation factor. Heat sinks made of copper and type-IIA diamond are designed to carry out the steady-state and transient thermal analysis of the device operating in CW and pulsed modes respectively. Authors have adopted Olson's method to carry out the transient analysis of the device, which clearly establishes the superiority of type-IIA diamond over copper as the heat sink material of the device from the standpoint of the undesirable effect of frequency chirping due to thermal transients in the pulsed mode. 展开更多
关键词 admittance characteristics chirp bandwidth frequency chirping junction temperature large-signal analysis transient thermal analysis
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Large-signal characterization of DDR silicon IMPATTs operating in millimeter-wave and terahertz regime 被引量:2
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作者 aritra acharyya Jit Chakraborty +4 位作者 Kausik Das Subir Datta Pritam De Suranjana Banerjee J.P.Banerjee 《Journal of Semiconductors》 EI CAS CSCD 2013年第10期46-53,共8页
The authors have carried out the large-signal characterization ofsilicon-based double-drift region (DDR) impact avalanche transit time (IMPATT) devices designed to operate up to 0.5 THz using a large-signal simula... The authors have carried out the large-signal characterization ofsilicon-based double-drift region (DDR) impact avalanche transit time (IMPATT) devices designed to operate up to 0.5 THz using a large-signal simulation method developed by the authors based on non-sinusoidal voltage excitation. The effect of band-to-band tunneling as well as parasitic series resistance on the large-signal properties of DDR Si IMPATTs have also been studied at different mm-wave and THz frequencies. Large-signal simulation results show that DDR Si IMPATT is capable of delivering peak RF power of 633.69 mW with 7.95% conversion efficiency at 94 GHz for 50% voltage modulation, whereas peak RF power output and efficiency fall to 81.08 mW and 2.01% respectively at 0.5 THz for same voltage modulation. The simulation results are compared with the experimental results and are found to be in close agreement. 展开更多
关键词 band to band tunneling DDR silicon IMPATTs large-signal simulation MILLIMETER-WAVE series resistance terahertz regime
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Large-signal characterizations of DDR IMPATT devices based on group Ⅲ–Ⅴ semiconductors at millimeter-wave and terahertz frequencies 被引量:1
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作者 aritra acharyya Aliva Mallik +4 位作者 Debopriya Banerjee Suman Ganguli Arindam Das Sudeepto Dasgupta J.P.Banerjee 《Journal of Semiconductors》 EI CAS CSCD 2014年第8期69-78,共10页
Large-signal (L-S) characterizations of double-drift region (DDR) impact avalanche transit time (IM- PATT) devices based on group III-V semiconductors such as wurtzite (Wz) GaN, GaAs and InP have been carried ... Large-signal (L-S) characterizations of double-drift region (DDR) impact avalanche transit time (IM- PATT) devices based on group III-V semiconductors such as wurtzite (Wz) GaN, GaAs and InP have been carried out at both millimeter-wave (mm-wave) and terahertz (THz) frequency bands. A L-S simulation technique based on a non-sinusoidal voltage excitation (NSVE) model developed by the authors has been used to obtain the high frequency properties of the above mentioned devices. The effect of band-to-band tunneling on the L-S properties of the device at different mm-wave and THz frequencies are also investigated. Similar studies are also carried out for DDR IMPATTs based on the most popular semiconductor material, i.e. Si, for the sake of comparison. A compara- tive study of the devices based on conventional semiconductor materials (i.e. GaAs, InP and Si) with those based on Wz-GaN shows significantly better performance capabilities of the latter at both mm-wave and THz frequencies. 展开更多
关键词 DDR IMPATTs GaN group Ⅲ-Ⅴ large-signal simulation MILLIMETER-WAVE terahertz regime WURTZITE
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Hot electron transport in wurtzite-GaN:effects of temperature and doping concentration
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作者 aritra acharyya 《Journal of Semiconductors》 EI CAS CSCD 2018年第7期48-53,共6页
The hot electron transport in wurtzite phase gallium nitride(Wz-GaN) has been studied in this paper. An analytical expression of electron drift velocity under the condition of impact ionization has been developed by... The hot electron transport in wurtzite phase gallium nitride(Wz-GaN) has been studied in this paper. An analytical expression of electron drift velocity under the condition of impact ionization has been developed by considering all major scattering mechanisms such as deformation potential acoustic phonon scattering, piezoelectric acoustic phonon scattering, optical phonon scattering, electron-electron scattering and ionizing scattering. Numerical calculations show that electron drift velocity in Wz-GaN saturates at 1.44 ×10^5 m/s at room temperature for the electron concentration of 10^22 m^-3. The effects of temperature and doping concentration on the hot electron drift velocity in Wz-GaN have also been studied. Results show that the saturation electron drift velocity varies from 1.91 ×10^5-0.77 ×10^5 m/s for the change in temperature within the range of 10-1000 K, for the electron concentration of 10^22 m^-3; whereas the same varies from 1.44 ×10^5-0.91 ×10^5 m/s at 300 K for the variation in the electron concentration within the range of 10^22-10^25 m^-3. The numerically calculated results have been compared with the Monte Carlo simulated results and experimental data reported earlier, and those are found to be in good agreement. 展开更多
关键词 electron drift velocity hot electron transport GAN scattering limited velocity
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Potentiality of semiconducting diamond as the base material of millimeter-wave and terahertz IMPATT devices
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作者 aritra acharyya Suranjana Banerjee J.P.Banerjee 《Journal of Semiconductors》 EI CAS CSCD 2014年第3期39-49,共11页
An attempt is made in this paper to explore the potentiality of semiconducting type-IIb diamond as the base material of double-drift region(DDR) impact avalanche transit time(IMPATT) devices operating at both mill... An attempt is made in this paper to explore the potentiality of semiconducting type-IIb diamond as the base material of double-drift region(DDR) impact avalanche transit time(IMPATT) devices operating at both millimetre-wave(mm-wave) and terahertz(THz) frequencies. A rigorous large-signal(L-S) simulation based on the non-sinusoidal voltage excitation(NSVE) model developed earlier by the authors is used in this study. At first,a simulation study based on avalanche response time reveals that the upper cut-off frequency for DDR diamond IMPATTs is 1.5 THz, while the same for conventional DDR Si IMPATTs is much smaller, i.e. 0.5 THz. The L-S simulationresultsshowthattheDDRdiamondIMPATTdevicedeliversapeakRFpowerof7.79Wwithan18.17%conversion efficiency at 94 GHz; while at 1.5 THz, the peak power output and conversion efficiency decrease to6.19mWand8.17%respectively,taking50%voltagemodulation.AcomparativestudyofDDRIMPATTsbasedon diamond and Si shows that the former excels over the later as regards high frequency and high power performance at both mm-wave and THz frequency bands. The effect of band to band tunneling on the L-S properties of DDR diamond and Si IMPATTs has also been studied at different mm-wave and THz frequencies. 展开更多
关键词 diamond IMPATTs DDR large-signal simulation millimeter-wave terahertz
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