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Investigation of sensitivity and threshold voltage shift of commercial MOSFETs in gamma irradiation 被引量:3
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作者 Saleh Ashrafi baharak eslami 《Nuclear Science and Techniques》 SCIE CAS CSCD 2016年第6期166-171,共6页
This article is about the absorbed-dose-dependent threshold voltage shift of the MOSFET transistors.Performance of the MOSFETs has been tested in different gate voltages.Sensitivity of the transistors for 662 ke V gam... This article is about the absorbed-dose-dependent threshold voltage shift of the MOSFET transistors.Performance of the MOSFETs has been tested in different gate voltages.Sensitivity of the transistors for 662 ke V gamma ray is studied in 1–5 Gy dose range.It was found that for transistors irradiated in biased mode,significant changes in the threshold voltage occurred,and the sensitivity to gamma rays increased with the bias voltage. 展开更多
关键词 阈值电压漂移 MOSFET Γ射线照射 敏感性 商业 吸收剂量 偏置电压 晶体管
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