An on-chip debug circuit based on Joint Test Action Group(JTAG)interface for L-digital signal processor(L-DSP)is proposed,which has debug functions such as storage resource access,central processing unit(CPU)pipeline ...An on-chip debug circuit based on Joint Test Action Group(JTAG)interface for L-digital signal processor(L-DSP)is proposed,which has debug functions such as storage resource access,central processing unit(CPU)pipeline control,hardware breakpoint/observation point,and parameter statistics.Compared with traditional debug mode,the proposed debug circuit completes direct transmission of data between peripherals and memory by adding data test-direct memory access(DT-DMA)module,which improves debug efficiency greatly.The proposed circuit was designed in a 0.18μm complementary metal-oxide-semiconductor(CMOS)process with an area of 167234.76μm~2 and a power consumption of 8.89 mW.And the proposed debug circuit and L-DSP were verified under a field programmable gate array(FPGA).Experimental results show that the proposed circuit has complete debug functions and the rate of DT-DMA for transferring debug data is three times faster than the CPU.展开更多
This paper presents a wide supply voltage range, high speed true random number generator（TRNG） based on ring oscillators, which have different prime number of inverters. And a simple Von Neumann corrector as post pr...This paper presents a wide supply voltage range, high speed true random number generator（TRNG） based on ring oscillators, which have different prime number of inverters. And a simple Von Neumann corrector as post processing is also realized to improve data randomness. Prototypes have been implemented and fabricated in 0.18 μm complementary metal oxide semiconductor（CMOS） technology with a wide range of supply voltage from 1.8 V to 3.6 V. The circuit occupies 4 500 μm2, and dissipates minimum 160 μW of power with sampling frequency of 20 MHz. Output bit rate range is from 100 kbit/s to 20 Mbit/s. Statistical test results, which were achieved from the die Hard battery of tests, demonstrate that output random numbers have a well characteristic of randomness.展开更多
基金supported by the China-Montenegro 3rd Science&Technology Exchange and Cooperation Project(3-7)the Open Research Fund of Hunan Provincial Key Laboratory of Flexible Electronic Materials Genome Engineering(202005)the Double First-Class Scientific Research International Cooperation Expansion Project of Changsha University of Science&Technology(2019ic18)。
文摘An on-chip debug circuit based on Joint Test Action Group(JTAG)interface for L-digital signal processor(L-DSP)is proposed,which has debug functions such as storage resource access,central processing unit(CPU)pipeline control,hardware breakpoint/observation point,and parameter statistics.Compared with traditional debug mode,the proposed debug circuit completes direct transmission of data between peripherals and memory by adding data test-direct memory access(DT-DMA)module,which improves debug efficiency greatly.The proposed circuit was designed in a 0.18μm complementary metal-oxide-semiconductor(CMOS)process with an area of 167234.76μm~2 and a power consumption of 8.89 mW.And the proposed debug circuit and L-DSP were verified under a field programmable gate array(FPGA).Experimental results show that the proposed circuit has complete debug functions and the rate of DT-DMA for transferring debug data is three times faster than the CPU.
基金supported by the National Natural Science Foundation of China (61376031)
文摘This paper presents a wide supply voltage range, high speed true random number generator（TRNG） based on ring oscillators, which have different prime number of inverters. And a simple Von Neumann corrector as post processing is also realized to improve data randomness. Prototypes have been implemented and fabricated in 0.18 μm complementary metal oxide semiconductor（CMOS） technology with a wide range of supply voltage from 1.8 V to 3.6 V. The circuit occupies 4 500 μm2, and dissipates minimum 160 μW of power with sampling frequency of 20 MHz. Output bit rate range is from 100 kbit/s to 20 Mbit/s. Statistical test results, which were achieved from the die Hard battery of tests, demonstrate that output random numbers have a well characteristic of randomness.
