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A Novel Method of Nanocontact Fabrication for Andreev Reflection Measurement
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作者 王天兴 魏红祥 +5 位作者 任聪 韩秀峰 Clifford E Langford R m bari m a Coey J m D 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2006年第4期591-597,共7页
A new method of nanocontact fabrication for Adreev reflection measurement based on the nanopore method using a SiN membrane with focused ion beam technique is presented. With this method, controllable, clean,tensionle... A new method of nanocontact fabrication for Adreev reflection measurement based on the nanopore method using a SiN membrane with focused ion beam technique is presented. With this method, controllable, clean,tensionless nano-contacts for spin polarization probing can be obtained. Measurements of the fabricated samples show complicated spectral structures with a zero bias anomaly and dip structures from quasipartical interactions. A control sample of Co40Fe40B20 is measured with Nb tip method. None of the measured spectra can be explained satisfactorily by present theory. Further analysis of the contact interface and a more complete theory are needed to extract a reliable spin polarization message with the point contact Andreev reflection method. 展开更多
关键词 point contact Andreev reflection CONTROLLABLE spin polarization
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