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Shedding light on electrodeposition dynamics tracked in situ via soft X-ray coherent diffraction imaging
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作者 George Kourousias benedetto bozzini +4 位作者 Alessandra Gianoncelli Michael W. M. Jones Mark Junker Grant van Riessen Maya Kiskinova 《Nano Research》 SCIE EI CAS CSCD 2016年第7期2046-2056,共11页
The in situ physicochemical analysis of nanostructured functional materials is crucial for advances in their design and production. X-ray coherent diffraction imaging (CDI) methods have recently demonstrated impress... The in situ physicochemical analysis of nanostructured functional materials is crucial for advances in their design and production. X-ray coherent diffraction imaging (CDI) methods have recently demonstrated impressive potential for characterizing such materials with a high spatial resolution and elemental sensitivity; however, moving from the current ex situ static regime to the in situ dynamic one remains a challenge. By combining soft X-ray ptychography and single-shot keyhole CDI, we performed the first in situ spatiotemporal study on an electrodeposition process in a sealed wet environment, employed for the fabrication of oxygen-reduction catalysts, which are key components for alkaline fuel cells and metal-air batteries. The results provide the first experimental demonstration of theoretically predicted Turing-Hopf electrochemical pattern formation resulting from morphochemical coupling, adding a new dimension for the in-depth in situ characterization of electrodeposition processes in space and time. 展开更多
关键词 in situ electrodeposition X-ray coherent diffractionimaging keyhole coherentdiffraction imaging (CDI) X-ray ptychography
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