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Design and tests of the prototype a beam monitor of the CSR external target experiment 被引量:6
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作者 Hu-Lin Wang Zhen Wang +21 位作者 Chao-Song Gao Jian-Wei Liao Xiang-Ming Sun Hai-Bo Yang Cheng-Xin Zhao Jun Liu Peng Ma Zi-Li Li bi-hui you Ping Yang Di Guo Le Xiao Dong-Liang Zhang Yue-Zhao Zhang Sheng Dong Wan-Han Feng Yu-Xin Qiao Zheng-Yu Hu Qing-Wen Ye Zeng-Tao Guo Guang-Ming Huang Feng Liu 《Nuclear Science and Techniques》 SCIE EI CAS CSCD 2022年第3期137-151,共15页
A prototype beam monitor was designed to provide tracking information for heavy-ion projectiles for the cool storage ring(CSR)external target experiment(CEE)at the Heavy Ion Research Facility in Lanzhou(HIRFL).High gr... A prototype beam monitor was designed to provide tracking information for heavy-ion projectiles for the cool storage ring(CSR)external target experiment(CEE)at the Heavy Ion Research Facility in Lanzhou(HIRFL).High granularity and direct charge sensing are the main features of this device.It measures the beam position in a two-dimensional(2D)plane transverse to the beam direction on an event-by-event basis.The current design consists of two field cages inside a single vessel that operates independently and has electrical drift fields in orthogonal directions.Preliminary tests of the prototype were performed using a^(241)Am a source.The results show that a spatial resolution of less than 40μm and a time resolution of less than 600 ns can be achieved. 展开更多
关键词 CEE Beam monitor Heavy ion Topmetal sensor Tracking Field cage
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Prototype of single-event effect localization system with CMOS pixel sensor 被引量:5
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作者 Jun Liu Zhuo Zhou +12 位作者 Dong Wang Shi-Qiang Zhou Xiang-Ming Sun Wei-Ping Ren bi-hui you Chao-Song Gao Le Xiao Ping Yang Di Guo Guang-Ming Huang Wei Zhou Cheng-Xin Zhao Min Wang 《Nuclear Science and Techniques》 SCIE EI CAS CSCD 2022年第11期10-20,共11页
The single-event effect(SEE) is a serious threat to electronics in radiation environments. The most important issue in radiation-hardening studies is the localization of the sensitive region in electronics to the SEE.... The single-event effect(SEE) is a serious threat to electronics in radiation environments. The most important issue in radiation-hardening studies is the localization of the sensitive region in electronics to the SEE. To solve this problem, a prototype based on a complementary metal oxide semiconductor(CMOS) pixel sensor, i.e., TopmetalM, was designed for SEE localization. A beam test was performed on the prototype at the radiation terminal of the Heavy Ion Research Facility in Lanzhou(HIRFL). The results indicated that the inherent deflection angle of the prototype to the beam was 1.7°, and the angular resolution was 0.6°. The prototype localized heavy ions with a position resolution of 3.4 μm. 展开更多
关键词 Single-event effect Radiation resistant Topmetal-M
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