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Structured illumination microscopy and its new developments 被引量:2
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作者 Jianling Chen caimin qiu +3 位作者 Minghai You Xiaogang Chen Hongqin Yang Shusen Xie 《Journal of Innovative Optical Health Sciences》 SCIE EI CAS 2016年第3期63-70,共8页
Optical microscopy allows us to observe the biological structures and processes within living cells.However,the spatial resolution of the optical microscopy is limited to about half of the wavelength by the light di&#... Optical microscopy allows us to observe the biological structures and processes within living cells.However,the spatial resolution of the optical microscopy is limited to about half of the wavelength by the light di®raction.Structured illumination microscopy(SIM),a type of new emerging super-resolution microscopy,doubles the spatial resolution by illuminating the specimen with a patterned light,and the sample and light source requirements of SIM are not as strict as the other super-resolution microscopy.In addition,SIM is easier to combine with the other imaging techniques to improve their imaging resolution,leading to the developments of diverse types of SIM.SIM has great potential to meet the various requirements of living cells imaging.Here,we review the recent developments of SIM and its combination with other imaging techniques. 展开更多
关键词 Structured illumination microscopy diffraction limit SUPER-RESOLUTION
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E®ect of light polariztion on pattern illumination super-resolution imaging
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作者 caimin qiu Jianling Chen +3 位作者 Zexian Hou Chaoxian Xu Shusen Xie Hongqin Yang 《Journal of Innovative Optical Health Sciences》 SCIE EI CAS 2016年第3期71-78,共8页
Far-¯eld°uorescence microscopy has made great progress in the spatial resolution,limited by light diffraction,since the super-resolution imaging technology appeared.And stimulated emission depletion(STED)mic... Far-¯eld°uorescence microscopy has made great progress in the spatial resolution,limited by light diffraction,since the super-resolution imaging technology appeared.And stimulated emission depletion(STED)microscopy and structured illumination microscopy(SIM)can be grouped into one class of the super-resolution imaging technology,which use pattern illumination strategy to circumvent the di®raction limit.We simulated the images of the beads of SIM imaging,the intensity distribution of STED excitation light and depletion light in order to observe effects of the polarized light on imaging quality.Compared to¯xed linear polarization,circularly polarized light is more suitable for SIM on reconstructed image.And right-handed circular polarization(CP)light is more appropriate for both the excitation and depletion light in STED system.Therefore the right-handed CP light would be the best candidate when the SIM and STED are combined into one microscope.Good understanding of the polarization will provide a reference for the patterned illumination experiment to achieve better resolution and better image quality. 展开更多
关键词 Structured illumination microscopy stimulated emission depletion microscopy polarized light di®raction limit
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