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Photoreflectance Study of GaN Films on Sapphire Substrate
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作者 QIN Lin-liong YANG Kai +5 位作者 ZHENG You-clou ZHANG Rong dai xing-jiang FENG Duan HUANG Zhen-chun J.C.Chen 《Chinese Physics Letters》 SCIE CAS CSCD 1996年第2期153-156,共4页
Photoreflectance was used to study the optical properties of single crystal hexagonal GaN finis on(0001)sapphire substrate grown by metalorganic chemical vapor deposition.The energy gap of GaN was determined as 3.400 ... Photoreflectance was used to study the optical properties of single crystal hexagonal GaN finis on(0001)sapphire substrate grown by metalorganic chemical vapor deposition.The energy gap of GaN was determined as 3.400 eV and the possible origin of the signal was discussed.Optical absorption and reflection were measured.The optical absorption edge of 3.38 eV,and the reilectivity peak at 3.3 eV, confirmed the results of photoreiiectance. 展开更多
关键词 GAN SAPPHIRE OPTICAL
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