期刊文献+
共找到1篇文章
< 1 >
每页显示 20 50 100
The property of Si/SiGe/Si heterostructure during thermal budget characterized by HRXRD
1
作者 CHENChang-Chun LIUZhi-Hong +4 位作者 HUANGWen-Tao douwei-zhi ZHANGWei TSIENPei-Hsin ZHUDe-Zhang 《Nuclear Science and Techniques》 SCIE CAS CSCD 2003年第4期238-241,共4页
Si/SiGe/Si heterostructures grown by ultra-high-vacuum chemical vapor deposition (UHVCVD) werecharacterized by Rutherford backscattering/Channeling (RBS/C) together with high resolution X ray diffraction(HRXRD). High ... Si/SiGe/Si heterostructures grown by ultra-high-vacuum chemical vapor deposition (UHVCVD) werecharacterized by Rutherford backscattering/Channeling (RBS/C) together with high resolution X ray diffraction(HRXRD). High quality SiGe base layer was obtained. The Si/SiGe/Si heterostructures were subject to conventionalfurnace annealing and rapid thermal annealing with temperature between 750 ℃ and 910 ℃. Both strain and its re-laxation degree in SiGe layer are calculated by HRXRD combined with elastic theory, which are never reported inother literatures. The rapid thermal annealing at elevated temperature between 880 ℃ and 910 ℃ for very short timehad almost no influence on the strain in Si0.84Ge0. 16 epilayer. However, high temperature (900℃) furnace annealingfor 1h prompted the strain in Si0.84Ge0.16 layer to relax. 展开更多
关键词 Si/SiGe/Si异质结构 热平衡 HRXRD 超高真空化学气相沉积 UHVCVD X射线衍射
下载PDF
上一页 1 下一页 到第
使用帮助 返回顶部