期刊文献+
共找到2篇文章
< 1 >
每页显示 20 50 100
On the continued acceleration of bomb casing fragments following casing fracture 被引量:3
1
作者 Michael D.HUTCHINSON david w.price 《Defence Technology(防务技术)》 SCIE EI CAS 2014年第2期211-218,共8页
It has been said that,once a bomb casing has fractured, "detonation gases will then stream around the fragments or bypass them,and the acceleration process stops there." However,while apparently copious gas ... It has been said that,once a bomb casing has fractured, "detonation gases will then stream around the fragments or bypass them,and the acceleration process stops there." However,while apparently copious gas flow through casing fractures indicates some pressure release,it is also an indication of significant gas drive pressure,post casing fracture.This paper shows two approaches to the problem of calculating the actual loss of drive.One presents first-order analytical calculations,in cylindrical geometry,of pressure loss to the inside surface of a fractured casing.The second shows the modelling of a selected example in the CTH code.Both approaches reveal that gas escape,while occurring at its own soundspeed relative to the adjacent casing fragments,has to compete with rapid radial expansion of the casing.Together with some historic experiments now publicly available,our calculations indicate that post-fracture casing fragment acceleration is,for most systems,unlikely to be reduced significantly. 展开更多
关键词 壳体破裂 外壳 炸弹 气体逸出 压力损失 计算表 加速过程 压力释放
下载PDF
消除产品良率隐藏的杀手——电子束检查是铜逻辑和晶圆代工厂的最佳方法
2
作者 david w.price Todd Henry Robert Fiordalice 《电子工业专用设备》 2005年第3期38-45,共8页
监控和消除隐藏的电路缺陷已成为130nm和130nm以下器件的关键。这使得电子束检查正在广泛应用于开发、试生产和量产的监控过程。我们将描述当前铜逻辑和晶圆代工厂电子束检查技术的执行情况,其中包括详细的案例研究,它说明了从开发到量... 监控和消除隐藏的电路缺陷已成为130nm和130nm以下器件的关键。这使得电子束检查正在广泛应用于开发、试生产和量产的监控过程。我们将描述当前铜逻辑和晶圆代工厂电子束检查技术的执行情况,其中包括详细的案例研究,它说明了从开发到量产过程中应用电子束检查技术的好处。我们也描述了过去克服通用工具障碍的方法。然后,分别介绍了利用电子束检查技术的新进展,以及为假设的20000WSPMφ300mm工厂模拟的最理想执行情况的最佳实例。 展开更多
关键词 电路缺陷 电子束检查 最佳方法
下载PDF
上一页 1 下一页 到第
使用帮助 返回顶部