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Machine learning for automated experimentation in scanning transmission electron microscopy
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作者 Sergei V.Kalinin debangshu mukherjee +9 位作者 Kevin Roccapriore Benjamin J.Blaiszik Ayana Ghosh Maxim A.Ziatdinov Anees Al-Najjar Christina Doty Sarah Akers Nageswara S.Rao Joshua C.Agar Steven R.Spurgeon 《npj Computational Materials》 SCIE EI CSCD 2023年第1期25-40,共16页
Machine learning(ML)has become critical for post-acquisition data analysis in(scanning)transmission electron microscopy,(S)TEM,imaging and spectroscopy.An emerging trend is the transition to real-time analysis and clo... Machine learning(ML)has become critical for post-acquisition data analysis in(scanning)transmission electron microscopy,(S)TEM,imaging and spectroscopy.An emerging trend is the transition to real-time analysis and closed-loop microscope operation.The effective use of ML in electron microscopy now requires the development of strategies for microscopy-centric experiment workflow design and optimization.Here,we discuss the associated challenges with the transition to active ML,including sequential data analysis and out-of-distribution drift effects,the requirements for edge operation,local and cloud data storage,and theory in the loop operations.Specifically,we discuss the relative contributions of human scientists and ML agents in the ideation,orchestration,and execution of experimental workflows,as well as the need to develop universal hyper languages that can apply across multiple platforms.These considerations will collectively inform the operationalization of ML in next-generation experimentation. 展开更多
关键词 OPTIMIZATION AUTOMATED EXECUTION
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